Hinweise zum Einsatz der Google Suche
Personensuchezur unisono Personensuche
Veranstaltungssuchezur unisono Veranstaltungssuche
Katalog plus

Publications of Prof. Dr. Ullrich Pietsch

Subject Year Link
C. Gutt, T. Sant, D. Kenszov, F. Capotondi, B. Pervaz, E. Pedersoli, M. Kiskinova, M. Klaui, H. Zabel, U. Pietsch: Probing ultrafast changes to a vertical spin density profile with resonant XUV magnetic reectivity at the free- electron laser FERMI, Structural Dynamics (submitted) 2017
Arman Davtyan, Sebastian Lehmann, Dominik Kriegner, Reza R. Zamani, Kimberly Dick, Danial Bahrami, Ali Al-Hassan, Steven J. Leake, Ullrich Pietsch Vaclav Holy: Characterisation of individual stacking faults in a wurtzite GaAs nanowire by Nanobeam x-ray diffraction, J. Appl. Cryst. 50, 673–680 2017
Nowsheen Goonoo, Behnam Khanbabaee, Marc Steuber, Archana Bhaw-Luximon, UlrichJonas, Ullrich Pietsch, Dhanjay Jhurry, and Holger Schönherr, κ– Carrageenan enhances the biomineralization and osteogenic differentiation of electrospun PHB and PHBV fibers, Biomolecules, (accepted) 2017
S. Grigorian, S. Escoubas, D. Duche, M. Aliouat, J.-J. Simon, D. Ksenzov, B. Bat-Erdene, S. Allard, U. Scherf, U. Pietsch, O. Thomas : A complex interrelationship between temperature-dependent polyquaterthiophene (PQT) structural and optoelectronic properties, J. Chem Phys.C (submitted) 2017
Ali Al Hassan, R. B. Lewis, H. Küpers, W.-H. Lin, M. Hanke, D. Bahrami, D. Salomon, A. Tahraoui, L. Geelhaar and U. Pietsch, Determination of Indium Content of GaAs/InxGa1-xAs/(GaAs) core-shell(-shell) nanowires by X-ray diffraction and Nano X-ray fluorescence , Nanotechnology, (submitted) 2017
T. Sant, D. Ksenzov, F. Capotondi, E. Pedersoli, M. Manfredda, M. Kiskinova, H. Zabel, M. Kläui, J. Lüning, U. Pietsch and C. Gutt1* Ultrafast nanoscale spin- reversal at the surface of the domain network of a ferromagnetic thin film, Nature materials (submitted) 2017
I. Vladimirov, M. Kühn, M. Kellermeier, T. Geßner, Z. Molla, S. Grigorian, U. Pietsch, F. May, R.T. Weitz: Surface-mediated crystallization of organic semiconductors for field-effect transistors with high electron mobilities, Nanoletters (submitted) 2017
Eduard Mikayelyan, Linda Grodd, Viacheslau Ksianzau, Daniel Wesner, Alexander Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko,ef Dimitri A. Ivanov, Ullrich Pietsch and Souren Grigorianai. Thin-Film Structure and Phase Transitions of Dihexyl-Quarterthiophene, Phys.Chem. Chem Phys. (submitted) 2017
M. Shokr, D. Schlosser, A. Abboud, A. Tosson, A. Al Ghashi, T. Conka Nurdan, R. Hartmann, L. Strüder , Ullrich Pietsch: Applications of a pnCCD Detector Coupled to Columnar Structure CsI(Tl) Scintillator System in Ultra High Energy X-ray Laue Diffraction, JINST, (submitted) 2017
T. Sant1, D. Ksenzov, F. Capotondi, E. Pedersoli, M. Manfredda, M. Kiskinova, H. Zabel,M. Kläui, J. Lüning, U. Pietsch and C. Gutt, Ultrafast nanoscale magnetization-reversal in the domain wall area at a metal/ferromagnetic film interface. Nature materials, (submitted) 2017
Mahmoud Al Humaidi, Julie Gai, Ullrich Pietsch, Claudia Wickleder, Structural and spectroscopic study of different Eu3+ doping concentrations in Sc2O3 nanoparticles, Zeitschrift 2017
P. Zellekens, T.Rieger ; N.Demarina ; Ali AlHassan ; F.J.Hackemueller ; H.Lueth ; U. Pietsch ;Th.Schaepers ; D.Gruetzmacher and M.Lepsa “Strain relaxation and ambipolar electrical transport in GaAs/InSb core-shell nanowires” Nanoscale (submitted) 2017
Hyeokmin Choe, Semen Gorfman, Stefan Heidbrink, Ullrich Pietsch, Marco Vogt, Jens Winter, and Michael Ziolkowski. Multi-Channel FPGA-Based Data-Acquisition-System for Time-Resolved Synchrotron Radiation Experiments. IEEE Transactions on Nuclear Science, Volume 99,DOI: 10.1109/TNS.2017.2655366 2017 Link
D. Schlosser, R. Hartmann, A. Bechteler, A. Abboud, M. Shokr, T. Nurdan, U. Pietsch, L. Strüder. A new spectroscopic imager for X-rays from 0.5 keV to 150 keV combining a pnCCD and a columnar CsI(Tl) scintillator. Jinst, Volume 12, DOI: 10.1088/1748-0221/12/04/P04009 2017 Link
Hyeokmin Choe, Stefan Heidbrink, Michael Ziolkowski, Ullrich Pietsch, Vadim Dyadkin, Semen Gorfman* and Dmitry Chernyshov: Microcontroller for in-situ single crystal diffraction measurements with PILATUS-2M detector under an alternating electric field, J.Appl.Cryst. 2017, Volume 50, 975 – 977, DOI: 10.1107/S1600576717006197 2017 Link
A. Abboud, Ch.Kirchlechner, S. Send, J. Keckes and U.Pietsch, Single-shot full strain tensor determination of microsized single crystalline copper with white x-ray microbeams, J.Appl. Cryst. 2017,50, 901 - 908 DOI: 10.1107/S1600576717005581 2017 Link
A. Davtyan, T. Krause, D. Kriegner, A. Al-Hassan, D. Bahrami, S. M. Mostafavi Kashani, R. B. Lewis, H. Küpers, A. Tahraoui, L. Geelhaar, M. Hanke, S. J. Leake, O. Loffeld and U. Pietsch. Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging. Journal of Applied Crystallography, Volume 50, DOI: 10.1107/S1600576717004149. 2017 Link
A. Davtyan, A. Biermanns, O. Loffeld, U. Pietsch. Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging. New Journal of Physics, Volume 18, Article Number: 063021, DOI: 10.1088/1367-2630/18/6/063021. 2016 Link
I. M. Fodchuk, I. I. Gutsuliak, V. V. Dovganiuk, A. O. Kotsyubynskiy, U. Pietsch, N. V. Pashniak, O. Yu. Bonchyk, I. M. Syvorotka, P. M. Lytvyn. Magnetic and structural changes in the near-surface epitaxial Y2.95La0.05Fe5O12 films after high-dose ion implantation. Applied Optics Vol. 55, Issue 12, pp. B144-B149; DOI: 10.1364/AO.55.00B144. 2016 Link
S. Gorfman, H. Simons, T. Iamsasri, S. Prasertpalichat, D. P. Cann, H. Choe, U. Pietsch, Y. Watier, J. L. Jones. Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics. Scientific Reports 6, Article number: 20829; DOI: 10.1038/srep20829. 2016 Link
S. Send, A. Abboud, N. Wiesner, M. Shokr, M. Klaus, C. Genzel, T. Conka-Nurdan, D. Schlosser, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays. J. Appl. Cryst. 49, 222-233, Part 1; DOI: 10.1107/S1600576715023997. 2016 Link
A. Seel, A. Davtyan, U. Pietsch, O. Loffeld. Norm minimized Scattering Data from Intensity Spectra. MATHEMATICAL PROBLEMS IN ENGINEERING, Article Number: 9853714; DOI: 10.1155/2016/9853714. 2016 Link
F. Alghabi, S. Send, U. Schipper, A. Abboud, U. Pietsch, A. Kolb. Fast GPU-based absolute intensity determination for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 11, Article Number: T01001; DOI: 10.1088/1748-0221/11/01/T01001. 2016 Link
J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, U. Pietsch, H. Ryll, S. Send, M. Simson, H. Soltau, J. Soltau, D. Steigenhöfer, L. Strüder. Controlled charge extraction - antiblooming capabilities in pnCCD imaging sensors. Journal of Instrumentation, Volume 11, Article Number: P01012; DOI: 10.1088/1748-0221/11/01/P01012. 2016 Link
D. M. Schlosser, M. Huth, R. Hartmann, A. Abboud, S. Send, T. Conka-Nurdan, M. Shokr, U. Pietsch, L. Strüder. Direct and indirect signal detection of 122 keV photons with a novel detector combining a pnCCD and a CsI(Tl) scintillator. Nuclear Inst. and Methods in Physics Research, A, Volume 805, p. 55-62, Special Issue: SI; DOI: 10.1016/j.nima.2015.08.065. 2016 Link
B. Dönges, K. Istomin, M. Söker, N. Schell, U. Krupp, U. Pietsch, C.-P. Fritzen, H.-J. Christ. Experimental investigation and numerical description of the damage evolution in a duplex stainless steel subjected to VHCF-loading. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, Volume 646, Pages 8–18; DOI: 10.1016/j.msea.2015.08.021. 2015 Link
A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Model study on how an ordered grouping of atoms affects their inner-shell photoionization. Phys. Rev. A 92, Issue: 3, Article Number: 033424; DOI: 10.1103/PhysRevA.92.033424 2015 Link
U. Krupp, A. Giertler, M. Söker, H. Fu, B. Dönges, H.-J. Christ, A. Hüsecken, U. Pietsch, C.-P. Fritzen, W. Ludwig. The behavior of short fatigue cracks during Very High Cycle (VHCF) Fatigue of duplex stainless steel. Engineering Fracture Mechanics, Volume 145, Pages 197–209; DOI: 10.1016/j.engfracmech.2015.03.024. 2015 Link
A. Habib, A. Shelke, M. Vogel, S. Brand, X. Jiang, U. Pietsch, S. Banerjee, T. Kundu. Quantitative Ultrasonic Characterization of c-Axis Oriented Polycrystalline AlN Thin Film for Smart Device Application. Acta acustica united with Acustica 101, No.4, pp.675-683; DOI: 10.3813/AAA.918863. 2015 Link
S. T. Salammal, S. Dai, U. Pietsch, S. Grigorian, N. Koenen, U. Scherf, N. Kayunkid, M. Brinkmann. Influence of alkyl side chain length on the in-plane stacking of room temperature and low temperature cast poly(3-alkylthiophene) thin films. European Polymer Journal, Volume 67, Pages 199–212; DOI: 10.1016/j.eurpolymj.2015.03.065. 2015 Link
H. Choe, S. Gorfman, M. Hinterstein, M. Ziolkowski, M. Knapp, S. Heidbrink, M. Vogt, J. Bednarcik, A. Berghäuser, H. Ehrenberg, U. Pietsch. Combining high time and angular resolutions: time-resolved X-ray powder diffraction using a multi-channel analyser detector. J. Appl. Cryst. 48, 970-974, Part: 3; DOI: 10.1107/S1600576715004598. 2015 Link
S. Gorfman, H. Choe, V. V. Shvartsman, M. Ziolkowski, M. Vogt, J. Strempfer, T. Łukasiewicz, U. Pietsch, J. Dec. Time-Resolved X-Ray Diffraction Reveals the Hidden Mechanism of High Piezoelectric Activity in a Uniaxial Ferroelectric. Phys. Rev. Lett. 114, Issue: 9, Article Number: 097601; DOI: 10.1103/PhysRevLett.114.097601. 2015 Link
P. Schroth, M. Köhl, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, A. Biermanns, S. Bauer, S. Lazarev, U. Pietsch, T. Baumbach. Evolution of Polytypism in GaAs Nanowires during Growth Revealed by Time-Resolved in situ x-ray Diffraction. Phys. Rev. Lett. 114, Issue: 5, Article Number: 055504; DOI: 10.1103/PhysRevLett.114.055504. 2015 Link
G. Bussone, H. Schäfer-Eberwein, E. Dimakis, A. Biermanns, D. Carbone, A. Tahraoui, L. Geelhaar, P. H. Bolívar, T. U. Schülli, U. Pietsch. Correlation of Electrical and Structural Properties of Single As-Grown GaAs Nanowires on Si (111) Substrates. Nano Lett., 15 (2), pp 981–989; DOI: 10.1021/nl5037879. 2015 Link
M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch, T. Baumbach. Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction. JOURNAL OF SYNCHROTRON RADIATION, Volume 22, Part 1, Pages 67-75; DOI: 10.1107/S1600577514023480. 2015 Link
C. Somaschini, A. Biermanns, S. Bietti, G. Bussone, A. Trampert, S. Sanguinetti, H. Riechert, U. Pietsch, L. Geelhaar. Axial InAs/GaAs heterostructures on silicon in a nanowire geometry. Nanotechnology, Volume 25, Number 48, Article Number: 485602; DOI: 10.1088/0957-4484/25/48/485602. 2014 Link
A. Biermanns, E. Dimakis, A. Davydok, T. Sasaki, L. Geelhaar, M. Takahasi, U. Pietsch. Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111). Nano Lett., 14(12), pp 6878–6883; DOI: 10.1021/nl502878a. 2014 Link
G. Bussone, E. Dimakis, R. Grifone, A. Biermanns, A. Tahraoui, D. Carbone, L. Geelhaar, T. U. Schülli, U. Pietsch. Impact of strain induced by polymer curing in benzocyclobutene embedded semiconductor nanostructures. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 8, Issue: 12, Pages: 1007-1010; DOI: 10.1002/pssr.201409346. 2014 Link
A. Leonov, D. Ksenzov, A. Benediktovitch, I. Feranchuk, U. Pietsch. Time dependence of X-ray polarizability of a crystal induced by an intense femtosecond X-ray pulse. IUCRJ, Volume: 1, Pages: 402-417, Part: 6; DOI: 10.1107/S2052252514018156. 2014 Link
A. Abboud, C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strüder, J. Keckes, U. Pietsch. A new method for polychromatic X-ray mu Laue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Rev. Sci. Instrum. 85, Issue: 11, Article Number: 113901; DOI: 10.1063/1.4900482. 2014 Link
F. Alghabi, S. Send, U. Schipper, A. Abboud, N. Pashniak, U. Pietsch, A. Kolb. Fast GPU-based spot extraction for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 9, Article Number: T11003; DOI: 10.1088/1748-0221/9/11/T11003. 2014 Link
B. Khanbabaee, S. Facsko, S. Doyle, U. Pietsch. Near-surface density profiling of Fe ion irradiated Si(100) using extremely asymmetric x-ray diffraction by variation of the wavelength. Appl. Phys. Lett. 105, Issue: 16, 163101; DOI: 10.1063/1.4899068. 2014 Link
T. Rieger, T. Jörres, J. Vogel, A. Biermanns, U. Pietsch, D. Grützmacher, M. I. Lepsa. Crystallization of HfO2 in InAs/HfO2 core-shell nanowires. Nanotechnology, Volume 25, Number 40, Article Number: 405701; DOI: 10.1088/0957-4484/25/40/405701. 2014 Link
K. Istomin, B. Dönges, N. Schell, H.-J. Christ, U. Pietsch. Analysis of VHCF damage in a duplex stainless steel using hard X-ray diffraction techniques. International Journal of Fatigue, Volume 66, Pages 177–182; DOI: 10.1016/j.ijfatigue.2014.04.001. 2014 Link
B. Khanbabaee, D. Lützenkirchen-Hecht, R. Hübner, J. Grenzer, S. Facsko, U. Pietsch. Near surface silicide formation after off-normal Fe-implantation of Si (001) surfaces. JOURNAL OF APPLIED PHYSICS, Volume: 116, Issue: 2, Article Number: 024301; DOI: 10.1063/1.4887516. 2014 Link
C. Gutt, L. Grodd, E. Mikayelyan, U. Pietsch, R. J. Kline, S. Grigorian. Local Orientational Structure of a P3HT pi-pi Conjugated Network Investigated by X-ray Nanodiffraction. JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 5(13), pp 2335–2339; DOI: 10.1021/jz500757p. 2014 Link
D. Lützenkirchen-Hecht, R. Wagner, S. Szillat, A. K. Hüsecken, K. Istomin, U. Pietsch, R. Frahm. The multi-purpose hard X-ray beamline BL10 at the DELTA storage ring. J. Synchrotron Rad., 21, 819-826, Part: 4; DOI: 10.1107/S1600577514006705. 2014 Link
A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Non-Markovian behavior of ultrafast coherent ionization dynamics in a crystal exposed to a seeded free-electron-laser pulse. PHYSICAL REVIEW A, Volume: 89, Issue: 6, Article Number: 063404; DOI: 10.1103/PhysRevA.89.063404. 2014 Link
E. Barrier, F. M. B. Fernandes, M. Bujan, M. C. Feiters, A. Froideval, J. Ghijsen, T. Hase, M. A. Hough, M. Jergel, I. Jimenez, T. Kajander, A. Kikas, M. Kokkinidis, L. Kover, H. B. Larsen, D. M. Lawson, K. Lawniczak-Jablonska, C. Mariani, P. Mikulik, J. Monnier, S. Morera, C. McGuinness, P. Müller-Buschbaum, M. Meedom Nielson, U. Pietsch, M. Tromp, M. Simon, J. Stangl, G. Zanotti. The benefit of the European User Community from transnational access to national radiation facilities. J. Synchrotron Rad. 21, 638-639, Part: 3; DOI: 10.1107/S1600577514007619. 2014 Link
A. Biermanns , D. Carbone , S. Breuer , V. L. R. Jacques , T. Schulli , L. Geelhaar , U. Pietsch. Distribution of zinc-blende twins and wurtzite segments in GaAs nanowires probed by X-ray nanodiffraction. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume 7, Issue 10, Pages 860–863, Special Issue: SI; DOI: 10.1002/pssr.201307246. 2013 Link
E. Dimakis, M. Ramsteiner, C.-N. Huang, A. Trampert, A. Davydok, A. Biermanns, U. Pietsch, H. Riechert, L. Geelhaar. In situ doping of catalyst-free InAs nanowires with Si: Growth, polytypism, and local vibrational modes of Si. Appl. Phys. Lett. 103, Issue: 14, 143121, (2013). ; DOI: 10.1063/1.4824344 2013 Link
B. Kaiser, A. Brand, M. Glässl, A. Vagov, V. M. Axt, U. Pietsch. Photoionization of resonantly driven atomic states by an extreme ultraviolet-free-electron laser: intensity dependence and renormalization of Rabi frequencies. New Journal of Physics, Volume 15, Article Number: 093016; DOI: 10.1088/1367-2630/15/9/093016. 2013 Link
S. Gorfman, O. Schmidt, V. Tsirelson, M. Ziolkowski, U. Pietsch. Crystallography under External Electric Field. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, Volume: 639, Issue: 11, Pages: 1953-1962, Special Issue: SI; DOI: 10.1002/zaac.201200497. 2013 Link
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T. U. Schülli, A. D. Wieck, U. Pietsch. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. J Appl Crystallogr., 46 (Pt 4), 887–892; DOI: 10.1107/S0021889813004226. 2013 Link
A. Davydok, T. Rieger, A. Biermanns, M. Saqib, T. Grap, M. I. Lepsa, U. Pietsch. Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B. J Appl Crystallogr., 46(Pt 4), 893–897; DOI: 10.1107/S0021889813010522. 2013 Link
K. Ali, U. Pietsch, S. Grigorian. Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique. J. Appl. Cryst., 46, 908-911, Part: 4; DOI: 10.1107/S0021889813004718. 2013 Link
S. Send, A. Abboud, R. Hartmann, M. Huth, W. Leitenberger, N. Pashniak, J. Schmidt, L. Strüder, U. Pietsch. Characterization of a pnCCD for applications with synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Volume 711, Pages 132–142; DOI: 10.1016/j.nima.2013.01.044. 2013 Link
A. Abboud, S. Send, N. Pashniak, W. Leitenberger, S. Ihle, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Sub-pixel resolution of a pnCCD for X-ray white beam applications. Journal of Instrumentation, Volume 8, Article Number: P05005; DOI: 10.1088/1748-0221/8/05/P05005. 2013 Link
B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer, U. Pietsch. Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 46, Pages: 505-511, Part: 2; DOI: 10.1107/S0021889813004597. 2013 Link
A. Biermanns, T. Rieger, G. Bussone, U. Pietsch, D. Grützmacher, M. I. Lepsa. Axial strain in GaAs/InAs core-shell nanowires. Appl. Phys. Lett. 102, Issue: 4, 043109; DOI: 10.1063/1.4790185. 2013 Link
K. P. Kandel, U. Pietsch, Z. Li, Ö. K. Öztürk. Doping induced structural changes in colloidal semiconductor nanowires. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, Volume: 15, Issue: 12, Pages: 4444-4450; DOI: 10.1039/c3cp44500c. 2013 Link
B. Khanbabaee, B. Arezki, A. Biermanns, M. Cornejo, D. Hirsch, D. Lützenkirchen-Hecht, F. Frost, U. Pietsch. Depth profile investigation of the incorporated iron atoms during Kr+ ion beam sputtering on Si (001). THIN SOLID FILMS, Volume: 527, Pages: 349-353; DOI: 10.1016/j.tsf.2012.12.055. 2013 Link
M. Porro, L. Andricek, S. Aschauer, M. Bayer, J. Becker, L. Bombelli, A. Castoldi, G. De Vita, I. Diehl, F. Erdinger, S. Facchinetti, C. Fiorini, P. Fischer, T. Gerlach, H. Graafsma, C. Guazzoni, K. Hansen, P. Kalavakuru, H. Klär, A. Kugel, P. Lechner, M. Lemke, G. Lutz, M. Manghisoni, D. Mezza, D. Müntefering, U. Pietsch, E. Quartieri, M. Randall, V. Re, C. Reckleben, C. Sandow, J. Soldat, L. Strüder, J. Szymanski, G. Weidenspointner, C. B. Wunderer. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, Volume: 59, Issue: 6, Pages: 3339-3351, Part: 2; DOI: 10.1109/TNS.2012.2217755. 2012 Link
A. Habib, A. Shelke, M. Vogel, U. Pietsch, X. Jiang, T. Kundu. Mechanical characterization of sintered piezo-electric ceramic material using scanning acoustic microscope. Ultrasonics, Volume 52, Issue 8, Pages 989–995; DOI: 10.1016/j.ultras.2012.07.011. 2012 Link
L. Grodd, U. Pietsch, S. Grigorian. Direct Correlation Between Electric and Structural Properties During Solidification of Poly(3-hexylthiophene) Drop-Cast Films. MACROMOLECULAR RAPID COMMUNICATIONS, Volume: 33, Issue: 20, Pages: 1765-1769; DOI: 10.1002/marc.201200309. 2012 Link
B. Brüser, I. Staude, G. von Freymann, M. Wegener, U. Pietsch. Visible light Laue diffraction from woodpile photonic crystals. APPLIED OPTICS, Volume: 51, Issue: 28, Pages: 6732-6737; DOI: 10.1364/AO.51.006732. 2012 Link
T. W. Cornelius, A. Davydok, V. L. R. Jacques, R. Grifone, T. Schülli, M.-I. Richard, G. Beutier, M. Verdier, T. H. Metzger, U. Pietsch, O. Thomas. In situ three-dimensional reciprocal-space mapping during mechanical deformation. JOURNAL OF SYNCHROTRON RADIATION, Volume: 19, Pages: 688-694, Part: 5; DOI: 10.1107/S0909049512023758. 2012 Link
T. S. Shabi, S. Grigorian, M. Brinkmann, U. Pietsch, N. Koenen, N. Kayunkid, U. Scherf. Enhancement in crystallinity of poly(3-hexylthiophene) thin films prepared by low-temperature drop casting. JOURNAL OF APPLIED POLYMER SCIENCE, Volume: 125, Issue: 3, Pages: 2335-2341; DOI: 10.1002/app.36447. 2012 Link
A. Biermanns, S. Breuer, A. Trampert, A. Davydok, L. Geelhaar, U. Pietsch. Strain accommodation in Ga-assisted GaAs nanowires grown on silicon (111). Nanotechnology, Volume 23, Number 30, Article Number: 305703; DOI: 10.1088/0957-4484/23/30/305703. 2012 Link
A. Neuhold, J. Novák, H.-G. Flesch, A. Moser, T. Djuric, L. Grodd, S. Grigorian, U. Pietsch, R. Resel. X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Volume: 284, Pages: 64-68; DOI: 10.1016/j.nimb.2011.07.105. 2012 Link
S. T. Salammal, E. Mikayelyan, S. Grigorian, U. Pietsch , N. Koenen, U. Scherf , N. Kayunkid, M. Brinkmann. Impact of Thermal Annealing on the Semicrystalline Nanomorphology of Spin-Coated Thin Films of Regioregular Poly(3-alkylthiophene)s as Observed by High-Resolution Transmission Electron Microscopy and Grazing Incidence X-ray Diffraction. Macromolecules, 45 (13), pp 5575–5585; DOI: 10.1021/ma300906v. 2012 Link
A. Habib, A. Shelke, M. Pluta, T. Kundu, U. Pietsch, W. Grill. Imaging of Acoustic Waves in Piezoelectric Ceramics by Coulomb Coupling. Japanese Journal of Applied Physics, Volume: 51, Issue: 7, Part: 2, Special Issue: SI, Article Number: 07GB05; DOI: 10.1143/JJAP.51.07GB05. 2012 Link
S. Send, A. Abboud, W. Leitenberger, M. S. Weiss, R. Hartmann, L. Strüder, U. Pietsch. Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 45, Pages: 517-522, Part: 3; DOI: 10.1107/S0021889812015038. 2012 Link
A. Biermanns, S. Breuer, A. Davydok, L. Geelhaar, U. Pietsch. Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 45, Pages: 239-244, Part: 2; DOI: 10.1107/S0021889812003007. 2012 Link
A. Davydok, S. Breuer, A. Biermanns, L. Geelhaar, U. Pietsch. Lattice parameter accommodation between GaAs(111) nanowires and Si(111) substrate after growth via Au-assisted molecular beam epitaxy. Nanoscale Research Letters, 7:109; DOI: 10.1186/1556-276X-7-109. 2012 Link
S. Grigorian, D. Tranchida, D. Ksenzov, F. Schäfers, H. Schönherr, U. Pietsch. Structural and morphological changes of P3HT films in the planar geometry of an OFET device under an applied electric field. European Polymer Journal, Volume 47, Issue 12, Pages 2189–2196; DOI: 10.1016/j.eurpolymj.2011.09.003. 2011 Link
A. Abboud, S. Send, R. Hartmann, L. Strüder, A. Savan, A. Ludwig, N. Zotov, U. Pietsch. Applications of an energy-dispersive pnCCD for X-ray reflectivity: Investigation of interdiffusion in Fe-Pt multilayers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume 208, Issue 11, Pages 2601–2607; DOI: 10.1002/pssa.201184268. 2011 Link
A. Biermanns, A. Hanisch, J. Grenzer, T. H. Metzger, U. Pietsch. Tuning the shape and damage in ion-beam induced ripples on silicon. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 208, Issue: 11, Pages: 2608-2611; DOI: 10.1002/pssa.201184269. 2011 Link
B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Ultrafast photoionization dynamics at high laser intensities in the xuv regime. PHYSICAL REVIEW A, Volume: 84, Issue: 4, Article Number: 043431; DOI: 10.1103/PhysRevA.84.043431. 2011 Link
D. Ksenzov, C. Schlemper, A. Davtyan, S. Bajt, F. Schäfers, U. Pietsch. A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 269, Issue 19, Pages 2124–2129; DOI: 10.1016/j.nimb.2011.07.002. 2011 Link
A. Biermanns, S. Breuer, A. Davydok, L. Geelhaar, U. Pietsch. Structural evolution of self-assisted GaAs nanowires grown on Si(111). PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 5, Issue: 4, Pages: 156-158; DOI: 10.1002/pssr.201105055. 2011 Link
B. Arezki, G. Schwarz, Y. Bodenthin, D. Luetzenkirchen-Hecht, C. Markert, R. Wagner, R. Frahm, D. G. Kurth, U. Pietsch. X-Ray Near-Edge Absorption Study of Temperature-Induced Low-Spin-to-High-Spin Change in Metallo-Supramolecular Assemblies. CHEMPHYSCHEM, Volume:12, Issue: 2, Pages: 405-410; DOI: 10.1002/cphc.201000428. 2011 Link
G. Schwarz, Y. Bodenthin, Z. Tomkowicz, W. Haase, T. Geue, J. Kohlbrecher, U. Pietsch, D. G. Kurth. Tuning the Structure and the Magnetic Properties of Metallo-supramolecular Polyelectrolyte-Amphiphile Complexes. J. Am. Chem. Soc., 133 (3), pp 547–558; DOI: 10.1021/ja108416a. 2011 Link
T. Sant, T. Panzner, U. Pietsch. Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity. APPLIED SURFACE SCIENCE, Volume: 257, Issue: 1, Pages: 266-270; DOI: 10.1016/j.apsusc.2010.06.083. 2010 Link
P. Huber, O. Bunk, U. Pietsch, M. Textor, T. Geue. Grazing Incidence Small Angle X-ray Scattering on Colloidal Crystals. JOURNAL OF PHYSICAL CHEMISTRY B, Volume: 114, Issue: 39, Pages: 12473-12479; DOI: 10.1021/jp103943y. 2010 Link
S. Gorfman, O. Schmidt, M. Ziolkowski, M. von Kozierowski, U. Pietsch. Time-resolved x-ray diffraction study of the piezoelectric crystal response to a fast change of an applied electric field. JOURNAL OF APPLIED PHYSICS, Volume: 108, Issue: 6, Article Number: 064911; DOI: 10.1063/1.3480996. 2010 Link
D. Ksenzov, C. Schlemper, U. Pietsch. Resonant soft x-ray reflectivity of Me/B4C multilayers near the boron K edge. APPLIED OPTICS, Volume: 49, Issue: 25, Pages: 4767-4773; DOI: 10.1364/AO.49.004767. 2010 Link
U. Pietsch, M. J. Cooper. European Synchrotron User Organization established. JOURNAL OF SYNCHROTRON RADIATION, Volume: 17, Pages: 428-429, Part: 3; DOI: 10.1107/S0909049510010484. 2010 Link
A. Davydok, A. Biermanns, U. Pietsch, J. Grenzer, H. Paetzelt, V. Gottschalch. X-Ray Diffraction from Periodically Patterned GaAs Nanorods Grown onto GaAs[111]B. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, Volume: 41A, Issue: 5, Pages: 1191-1195; DOI: 10.1007/s11661-009-9868-3. 2010 Link
A. Hanisch, A. Biermanns, J. Grenzer, S. Facsko, U. Pietsch. Xe ion beam induced rippled structures on differently oriented single-crystalline Si surfaces. JOURNAL OF PHYSICS D-APPLIED PHYSICS, Volume: 43, Issue: 11, Article Number: 112001; DOI: 10.1088/0022-3727/43/11/112001. 2010 Link
L. Strüder, S. Epp, D. Rolles, R. Hartmann, P. Holl, G. Lutz, H. Soltau, R. Eckart, C. Reich, K. Heinzinger, C. Thamm, A. Rudenko, F. Krasniqi, K.-U. Kühnel, C. Bauer, C.-D. Schröter, R. Moshammer, S. Techert, D. Miessner, M. Porro, O. Hälker, N. Meidinger, N. Kimmel, R. Andritschke, F. Schopper, G. Weidenspointner, A. Ziegler, D. Pietschner, S. Herrmann, U. Pietsch, A. Walenta, W. Leitenberger, C. Bostedt, T. Möller, D. Rupp, M. Adolph, H. Graafsma, H. Hirsemann, K. Gärtner, R. Richter, L. Foucar, R. L. Shoeman, I. Schlichting, J. Ullrich. Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Volume: 614, Issue: 3, Pages: 483-496; DOI: 10.1016/j.nima.2009.12.053. 2010 Link
M. Wiatrowski, E. Dobruchowska, W. Maniukiewicz, U. Pietsch, J. Kowalski, Z. Szamel, J. Ulanski. Self-assembly of perylenediimide based semiconductor on polymer substrate. THIN SOLID FILMS, Volume: 518, Issue: 8, Pages: 2266-2270; DOI: 10.1016/j.tsf.2009.08.037. 2010 Link
D. Ksenzov, T. Panzner, C. Schlemper, C. Morawe, U. Pietsch. Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer. APPLIED OPTICS, Volume: 48, Issue: 35, Pages: 6684-6691; DOI: 10.1364/AO.48.006684. 2009 Link
S. Send, M. von Kozierowski, T. Panzner, S. Gorfman, K. Nurdan, A. H. Walenta, U. Pietsch, W. Leitenberger, R. Hartmann, L. Strüder. Energy-dispersive Laue diffraction by means of a frame-store pnCCD. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 42, Pages: 1139-1146, Part: 6; DOI: 10.1107/S0021889809039867. 2009 Link
M. Bulatov, V. Rusakov, U. Pietsch, T. Panzner. Structure and Magnetic Characteristics of Metal-Polymeric Nanocomposites with Different Fe and Ni Concentrations on the Basis of Polyacrylonitrile. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, Volume: 4, Issue: 3, Pages: 325-328; DOI: 10.1166/jno.2009.1048. 2009 Link
Z. Li, Ö. Kurtulus, N. Fu, Z. Wang, A. Kornowski, U. Pietsch, A. Mews. Controlled Synthesis of CdSe Nanowires by Solution-Liquid-Solid Method. ADVANCED FUNCTIONAL MATERIALS, Volume: 19, Issue: 22, Pages: 3650-3661; DOI: 10.1002/adfm.200900569. 2009 Link
A. Biermanns, A. Davydok, H. Paetzelt, A. Diaz, V. Gottschalch, T. H. Metzger, U. Pietsch. Individual GaAs nanorods imaged by coherent X-ray diffraction. JOURNAL OF SYNCHROTRON RADIATION, Volume: 16, Pages: 796-802, Part: 6; DOI: 10.1107/S0909049509032889 2009 Link
Y. Bodenthin, G. Schwarz, Z. Tomkowicz, M. Lommel, T. Geue, W. Haase, H. Möhwald, U. Pietsch, D. G. Kurth. Spin-crossover phenomena in extended multi-component metallo-supramolecular assemblies. COORDINATION CHEMISTRY REVIEWS, Volume: 253, Issue: 19-20, Pages: 2414-2422; DOI: 10.1016/j.ccr.2008.10.019. 2009 Link
J. Bauer, U. Pietsch, A. Davydok, A. Biermanns, J. Grenzer, V. Gottschalch, G. Wagner. X-ray investigation of the interface structure of free standing InAs nanowires grown on GaAs [(1)over-bar(1)over-bar(1)over-bar](B). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. Volume: 96, Issue: 4, Pages: 851-859; DOI: 10.1007/s00339-009-5318-8. 2009 Link
A. Davydok, A. Biermanns, U. Pietsch, J. Grenzer, H. Paetzelt, V. Gottschalch, J. Bauer. Submicron resolution X-ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1704-1708, Special Issue: SI; DOI: 10.1002/pssa.200881586. 2009 Link
J. Grenzer, A. Biermanns, A. Mücklich, S. A. Grigorian, U. Pietsch. Ripple structures on surfaces and underlying crystalline layers in ion beam irradiated Si wafers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1731-1735; DOI: 10.1002/pssa.200881589. 2009 Link
Ö. Kurtuluş, Z. Li, A. Mews, U. Pietsch. X-ray investigation of CdSe nanowires. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1752-1756; DOI: 10.1002/pssa.200881614. 2009 Link
D. Ksenzov, S. Grigorian, S. Hendel, F. Bienert, M. D. Sacher, U. Heinzmann, U. Pietsch. Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1875-1879; DOI: 10.1002/pssa.200881585. 2009 Link
S. Joshi, P. Pingel, S. Grigorian, T. Panzner, U. Pietsch, D. Neher, M. Forster, U. Scherf. Bimodal Temperature Behavior of Structure and Mobility in High Molecular Weight P3HT Thin Films. MACROMOLECULES, Volume: 42, Issue: 13, Pages: 4651-4660; DOI: 10.1021/ma900021w. 2009 Link
O. Schmidt, S. Gorfman, L. Bohatý, E. Neumann, B. Engelen, U. Pietsch. Investigations of the bond-selective response in a piezoelectric Li2SO4 center dot H2O crystal to an applied external electric field. ACTA CRYSTALLOGRAPHICA SECTION A, Volume: 65, Pages: 267-275, Part: 4; DOI: 10.1107/S0108767309015566. 2009 Link
P. U. Veer, U. Pietsch, M. Saphiannikova. Time and temperature dependence of surface relief grating formation in polymers containing azobenzene groups with different dipole moment. JOURNAL OF APPLIED PHYSICS, Volume: 106, Issue: 1, Article Number: 014909; DOI: 10.1063/1.3159652. 2009 Link
P. U. Veer, U. Pietsch, A. D. Mueller. Alteration of the mechanical properties of azopolymer film in the process of surface relief grating formation. APPLIED PHYSICS LETTERS, Volume: 94, Issue: 23, Article Number: 231911; DOI: 10.1063/1.3153847. 2009 Link
D. Carbone, A. Biermanns, B. Ziberi, F. Frost, O. Plantevin, U. Pietsch, T. H. Metzger. Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques. JOURNAL OF PHYSICS-CONDENSED MATTER, Volume: 21, Issue: 22, Article Number: 224007; DOI: 10.1088/0953-8984/21/22/224007. 2009 Link
V. R. Reddy, A. Gupta, A. Gome, W. Leitenberger, U. Pietsch. In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L1(0) ordering in Fe-57/Pt multilayers. JOURNAL OF PHYSICS-CONDENSED MATTER, Volume: 21, Issue: 18, Article Number: 186002; DOI: 10.1088/0953-8984/21/18/186002. 2009 Link
Y. Bodenthin, G. Schwarz, Z. Tomkowicz, T. Geue, W. Haase, U. Pietsch, D. G. Kurth. Liquid Crystalline Phase Transition Induces Spin Crossover in a Polyelectrolyte Amphiphile Complex. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, Volume: 131, Issue: 8, Pages: 2934-2941; DOI: 10.1021/ja808278s. 2009 Link
B. Reinhold, T. Geue, P. Huber, T. Sant, U. Pietsch, M. Sztucki. In Situ and Ex Situ SAXS Investigation of Colloidal Sedimentation onto Laterally Patterned Support. LANGMUIR, Volume: 25, Issue: 2, Pages: 814-819; DOI: 10.1021/la803078b. 2009 Link