| Subject | Year | Link |
| C. Gutt, T. Sant, D. Kenszov, F. Capotondi, B. Pervaz, E. Pedersoli, M. Kiskinova, M. Klaui, H. Zabel, U. Pietsch: Probing ultrafast changes to a vertical spin density profile with resonant XUV magnetic reectivity at the free- electron laser FERMI, Structural Dynamics (submitted) | 2017 | |
| Arman Davtyan, Sebastian Lehmann, Dominik Kriegner, Reza R. Zamani, Kimberly Dick, Danial Bahrami, Ali Al-Hassan, Steven J. Leake, Ullrich Pietsch Vaclav Holy: Characterisation of individual stacking faults in a wurtzite GaAs nanowire by Nanobeam x-ray diffraction, J. Appl. Cryst. 50, 673–680 | 2017 | |
| Nowsheen Goonoo, Behnam Khanbabaee, Marc Steuber, Archana Bhaw-Luximon, UlrichJonas, Ullrich Pietsch, Dhanjay Jhurry, and Holger Schönherr, κ– Carrageenan enhances the biomineralization and osteogenic differentiation of electrospun PHB and PHBV fibers, Biomolecules, (accepted) | 2017 | |
| S. Grigorian, S. Escoubas, D. Duche, M. Aliouat, J.-J. Simon, D. Ksenzov, B. Bat-Erdene, S. Allard, U. Scherf, U. Pietsch, O. Thomas : A complex interrelationship between temperature-dependent polyquaterthiophene (PQT) structural and optoelectronic properties, J. Chem Phys.C (submitted) | 2017 | |
| Abboud, B. Dönges, M. Shokr, A. Tosson, J-S. Micha, R. Hartmann, L. Strüder, H.-J. Christ, U. Pietsch, LATTICE TILT AND SUBDIVISION OF GRAINS DURING CRACK FORMATION IN VHCF DUPLEX STAINLESS STEEL USING MICROBEAM X-RAY LAUE DIFFRACTION , VHCF7 (submitted) | 2017 | |
| Ali Al Hassan, R. B. Lewis, H. Küpers, W.-H. Lin, M. Hanke, D. Bahrami, D. Salomon, A. Tahraoui, L. Geelhaar and U. Pietsch, Determination of Indium Content of GaAs/InxGa1-xAs/(GaAs) core-shell(-shell) nanowires by X-ray diffraction and Nano X-ray fluorescence , Nanotechnology, (submitted) | 2017 | |
| T. Sant, D. Ksenzov, F. Capotondi, E. Pedersoli, M. Manfredda, M. Kiskinova, H. Zabel, M. Kläui, J. Lüning, U. Pietsch and C. Gutt1* Ultrafast nanoscale spin- reversal at the surface of the domain network of a ferromagnetic thin film, Nature materials (submitted) | 2017 | |
| I. Vladimirov, M. Kühn, M. Kellermeier, T. Geßner, Z. Molla, S. Grigorian, U. Pietsch, F. May, R.T. Weitz: Surface-mediated crystallization of organic semiconductors for field-effect transistors with high electron mobilities, Nanoletters (submitted) | 2017 | |
| Eduard Mikayelyan, Linda Grodd, Viacheslau Ksianzau, Daniel Wesner, Alexander Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko,ef Dimitri A. Ivanov, Ullrich Pietsch and Souren Grigorianai. Thin-Film Structure and Phase Transitions of Dihexyl-Quarterthiophene, Phys.Chem. Chem Phys. (submitted) | 2017 | |
| M. Shokr, D. Schlosser, A. Abboud, A. Tosson, A. Al Ghashi, T. Conka Nurdan, R. Hartmann, L. Strüder , Ullrich Pietsch: Applications of a pnCCD Detector Coupled to Columnar Structure CsI(Tl) Scintillator System in Ultra High Energy X-ray Laue Diffraction, JINST, (submitted) | 2017 | |
| T. Sant1, D. Ksenzov, F. Capotondi, E. Pedersoli, M. Manfredda, M. Kiskinova, H. Zabel,M. Kläui, J. Lüning, U. Pietsch and C. Gutt, Ultrafast nanoscale magnetization-reversal in the domain wall area at a metal/ferromagnetic film interface. Nature materials, (submitted) | 2017 | |
| Mahmoud Al Humaidi, Julie Gai, Ullrich Pietsch, Claudia Wickleder, Structural and spectroscopic study of different Eu3+ doping concentrations in Sc2O3 nanoparticles, Zeitschrift | 2017 | |
| P. Zellekens, T.Rieger ; N.Demarina ; Ali AlHassan ; F.J.Hackemueller ; H.Lueth ; U. Pietsch ;Th.Schaepers ; D.Gruetzmacher and M.Lepsa “Strain relaxation and ambipolar electrical transport in GaAs/InSb core-shell nanowires” Nanoscale (submitted) | 2017 | |
| Hyeokmin Choe, Semen Gorfman, Stefan Heidbrink, Ullrich Pietsch, Marco Vogt, Jens Winter, and Michael Ziolkowski. Multi-Channel FPGA-Based Data-Acquisition-System for Time-Resolved Synchrotron Radiation Experiments. IEEE Transactions on Nuclear Science, Volume 99,DOI: 10.1109/TNS.2017.2655366 | 2017 | Link |
| D. Schlosser, R. Hartmann, A. Bechteler, A. Abboud, M. Shokr, T. Nurdan, U. Pietsch, L. Strüder. A new spectroscopic imager for X-rays from 0.5 keV to 150 keV combining a pnCCD and a columnar CsI(Tl) scintillator. Jinst, Volume 12, DOI: 10.1088/1748-0221/12/04/P04009 | 2017 | Link |
| Hyeokmin Choe, Stefan Heidbrink, Michael Ziolkowski, Ullrich Pietsch, Vadim Dyadkin, Semen Gorfman* and Dmitry Chernyshov: Microcontroller for in-situ single crystal diffraction measurements with PILATUS-2M detector under an alternating electric field, J.Appl.Cryst. 2017, Volume 50, 975 – 977, DOI: 10.1107/S1600576717006197 | 2017 | Link |
| A. Abboud, Ch.Kirchlechner, S. Send, J. Keckes and U.Pietsch, Single-shot full strain tensor determination of microsized single crystalline copper with white x-ray microbeams, J.Appl. Cryst. 2017,50, 901 - 908 DOI: 10.1107/S1600576717005581 | 2017 | Link |
| A. Davtyan, T. Krause, D. Kriegner, A. Al-Hassan, D. Bahrami, S. M. Mostafavi Kashani, R. B. Lewis, H. Küpers, A. Tahraoui, L. Geelhaar, M. Hanke, S. J. Leake, O. Loffeld and U. Pietsch. Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging. Journal of Applied Crystallography, Volume 50, DOI: 10.1107/S1600576717004149. | 2017 | Link |
| A. Davtyan, A. Biermanns, O. Loffeld, U. Pietsch. Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging. New Journal of Physics, Volume 18, Article Number: 063021, DOI: 10.1088/1367-2630/18/6/063021. | 2016 | Link |
| I. M. Fodchuk, I. I. Gutsuliak, V. V. Dovganiuk, A. O. Kotsyubynskiy, U. Pietsch, N. V. Pashniak, O. Yu. Bonchyk, I. M. Syvorotka, P. M. Lytvyn. Magnetic and structural changes in the near-surface epitaxial Y2.95La0.05Fe5O12 films after high-dose ion implantation. Applied Optics Vol. 55, Issue 12, pp. B144-B149; DOI: 10.1364/AO.55.00B144. | 2016 | Link |
| S. Gorfman, H. Simons, T. Iamsasri, S. Prasertpalichat, D. P. Cann, H. Choe, U. Pietsch, Y. Watier, J. L. Jones. Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics. Scientific Reports 6, Article number: 20829; DOI: 10.1038/srep20829. | 2016 | Link |
| S. Send, A. Abboud, N. Wiesner, M. Shokr, M. Klaus, C. Genzel, T. Conka-Nurdan, D. Schlosser, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays. J. Appl. Cryst. 49, 222-233, Part 1; DOI: 10.1107/S1600576715023997. | 2016 | Link |
| A. Seel, A. Davtyan, U. Pietsch, O. Loffeld. Norm minimized Scattering Data from Intensity Spectra. MATHEMATICAL PROBLEMS IN ENGINEERING, Article Number: 9853714; DOI: 10.1155/2016/9853714. | 2016 | Link |
| F. Alghabi, S. Send, U. Schipper, A. Abboud, U. Pietsch, A. Kolb. Fast GPU-based absolute intensity determination for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 11, Article Number: T01001; DOI: 10.1088/1748-0221/11/01/T01001. | 2016 | Link |
| J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, U. Pietsch, H. Ryll, S. Send, M. Simson, H. Soltau, J. Soltau, D. Steigenhöfer, L. Strüder. Controlled charge extraction - antiblooming capabilities in pnCCD imaging sensors. Journal of Instrumentation, Volume 11, Article Number: P01012; DOI: 10.1088/1748-0221/11/01/P01012. | 2016 | Link |
| D. M. Schlosser, M. Huth, R. Hartmann, A. Abboud, S. Send, T. Conka-Nurdan, M. Shokr, U. Pietsch, L. Strüder. Direct and indirect signal detection of 122 keV photons with a novel detector combining a pnCCD and a CsI(Tl) scintillator. Nuclear Inst. and Methods in Physics Research, A, Volume 805, p. 55-62, Special Issue: SI; DOI: 10.1016/j.nima.2015.08.065. | 2016 | Link |
| B. Dönges, K. Istomin, M. Söker, N. Schell, U. Krupp, U. Pietsch, C.-P. Fritzen, H.-J. Christ. Experimental investigation and numerical description of the damage evolution in a duplex stainless steel subjected to VHCF-loading. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, Volume 646, Pages 8–18; DOI: 10.1016/j.msea.2015.08.021. | 2015 | Link |
| A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Model study on how an ordered grouping of atoms affects their inner-shell photoionization. Phys. Rev. A 92, Issue: 3, Article Number: 033424; DOI: 10.1103/PhysRevA.92.033424 | 2015 | Link |
| U. Krupp, A. Giertler, M. Söker, H. Fu, B. Dönges, H.-J. Christ, A. Hüsecken, U. Pietsch, C.-P. Fritzen, W. Ludwig. The behavior of short fatigue cracks during Very High Cycle (VHCF) Fatigue of duplex stainless steel. Engineering Fracture Mechanics, Volume 145, Pages 197–209; DOI: 10.1016/j.engfracmech.2015.03.024. | 2015 | Link |
| A. Habib, A. Shelke, M. Vogel, S. Brand, X. Jiang, U. Pietsch, S. Banerjee, T. Kundu. Quantitative Ultrasonic Characterization of c-Axis Oriented Polycrystalline AlN Thin Film for Smart Device Application. Acta acustica united with Acustica 101, No.4, pp.675-683; DOI: 10.3813/AAA.918863. | 2015 | Link |
| S. T. Salammal, S. Dai, U. Pietsch, S. Grigorian, N. Koenen, U. Scherf, N. Kayunkid, M. Brinkmann. Influence of alkyl side chain length on the in-plane stacking of room temperature and low temperature cast poly(3-alkylthiophene) thin films. European Polymer Journal, Volume 67, Pages 199–212; DOI: 10.1016/j.eurpolymj.2015.03.065. | 2015 | Link |
| H. Choe, S. Gorfman, M. Hinterstein, M. Ziolkowski, M. Knapp, S. Heidbrink, M. Vogt, J. Bednarcik, A. Berghäuser, H. Ehrenberg, U. Pietsch. Combining high time and angular resolutions: time-resolved X-ray powder diffraction using a multi-channel analyser detector. J. Appl. Cryst. 48, 970-974, Part: 3; DOI: 10.1107/S1600576715004598. | 2015 | Link |
| S. Gorfman, H. Choe, V. V. Shvartsman, M. Ziolkowski, M. Vogt, J. Strempfer, T. Łukasiewicz, U. Pietsch, J. Dec. Time-Resolved X-Ray Diffraction Reveals the Hidden Mechanism of High Piezoelectric Activity in a Uniaxial Ferroelectric. Phys. Rev. Lett. 114, Issue: 9, Article Number: 097601; DOI: 10.1103/PhysRevLett.114.097601. | 2015 | Link |
| P. Schroth, M. Köhl, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, A. Biermanns, S. Bauer, S. Lazarev, U. Pietsch, T. Baumbach. Evolution of Polytypism in GaAs Nanowires during Growth Revealed by Time-Resolved in situ x-ray Diffraction. Phys. Rev. Lett. 114, Issue: 5, Article Number: 055504; DOI: 10.1103/PhysRevLett.114.055504. | 2015 | Link |
| G. Bussone, H. Schäfer-Eberwein, E. Dimakis, A. Biermanns, D. Carbone, A. Tahraoui, L. Geelhaar, P. H. Bolívar, T. U. Schülli, U. Pietsch. Correlation of Electrical and Structural Properties of Single As-Grown GaAs Nanowires on Si (111) Substrates. Nano Lett., 15 (2), pp 981–989; DOI: 10.1021/nl5037879. | 2015 | Link |
| M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch, T. Baumbach. Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction. JOURNAL OF SYNCHROTRON RADIATION, Volume 22, Part 1, Pages 67-75; DOI: 10.1107/S1600577514023480. | 2015 | Link |
| C. Somaschini, A. Biermanns, S. Bietti, G. Bussone, A. Trampert, S. Sanguinetti, H. Riechert, U. Pietsch, L. Geelhaar. Axial InAs/GaAs heterostructures on silicon in a nanowire geometry. Nanotechnology, Volume 25, Number 48, Article Number: 485602; DOI: 10.1088/0957-4484/25/48/485602. | 2014 | Link |
| A. Biermanns, E. Dimakis, A. Davydok, T. Sasaki, L. Geelhaar, M. Takahasi, U. Pietsch. Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111). Nano Lett., 14(12), pp 6878–6883; DOI: 10.1021/nl502878a. | 2014 | Link |
| G. Bussone, E. Dimakis, R. Grifone, A. Biermanns, A. Tahraoui, D. Carbone, L. Geelhaar, T. U. Schülli, U. Pietsch. Impact of strain induced by polymer curing in benzocyclobutene embedded semiconductor nanostructures. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 8, Issue: 12, Pages: 1007-1010; DOI: 10.1002/pssr.201409346. | 2014 | Link |
| A. Leonov, D. Ksenzov, A. Benediktovitch, I. Feranchuk, U. Pietsch. Time dependence of X-ray polarizability of a crystal induced by an intense femtosecond X-ray pulse. IUCRJ, Volume: 1, Pages: 402-417, Part: 6; DOI: 10.1107/S2052252514018156. | 2014 | Link |
| A. Abboud, C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strüder, J. Keckes, U. Pietsch. A new method for polychromatic X-ray mu Laue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Rev. Sci. Instrum. 85, Issue: 11, Article Number: 113901; DOI: 10.1063/1.4900482. | 2014 | Link |
| F. Alghabi, S. Send, U. Schipper, A. Abboud, N. Pashniak, U. Pietsch, A. Kolb. Fast GPU-based spot extraction for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 9, Article Number: T11003; DOI: 10.1088/1748-0221/9/11/T11003. | 2014 | Link |
| B. Khanbabaee, S. Facsko, S. Doyle, U. Pietsch. Near-surface density profiling of Fe ion irradiated Si(100) using extremely asymmetric x-ray diffraction by variation of the wavelength. Appl. Phys. Lett. 105, Issue: 16, 163101; DOI: 10.1063/1.4899068. | 2014 | Link |
| T. Rieger, T. Jörres, J. Vogel, A. Biermanns, U. Pietsch, D. Grützmacher, M. I. Lepsa. Crystallization of HfO2 in InAs/HfO2 core-shell nanowires. Nanotechnology, Volume 25, Number 40, Article Number: 405701; DOI: 10.1088/0957-4484/25/40/405701. | 2014 | Link |
| K. Istomin, B. Dönges, N. Schell, H.-J. Christ, U. Pietsch. Analysis of VHCF damage in a duplex stainless steel using hard X-ray diffraction techniques. International Journal of Fatigue, Volume 66, Pages 177–182; DOI: 10.1016/j.ijfatigue.2014.04.001. | 2014 | Link |
| B. Khanbabaee, D. Lützenkirchen-Hecht, R. Hübner, J. Grenzer, S. Facsko, U. Pietsch. Near surface silicide formation after off-normal Fe-implantation of Si (001) surfaces. JOURNAL OF APPLIED PHYSICS, Volume: 116, Issue: 2, Article Number: 024301; DOI: 10.1063/1.4887516. | 2014 | Link |
| C. Gutt, L. Grodd, E. Mikayelyan, U. Pietsch, R. J. Kline, S. Grigorian. Local Orientational Structure of a P3HT pi-pi Conjugated Network Investigated by X-ray Nanodiffraction. JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 5(13), pp 2335–2339; DOI: 10.1021/jz500757p. | 2014 | Link |
| D. Lützenkirchen-Hecht, R. Wagner, S. Szillat, A. K. Hüsecken, K. Istomin, U. Pietsch, R. Frahm. The multi-purpose hard X-ray beamline BL10 at the DELTA storage ring. J. Synchrotron Rad., 21, 819-826, Part: 4; DOI: 10.1107/S1600577514006705. | 2014 | Link |
| A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Non-Markovian behavior of ultrafast coherent ionization dynamics in a crystal exposed to a seeded free-electron-laser pulse. PHYSICAL REVIEW A, Volume: 89, Issue: 6, Article Number: 063404; DOI: 10.1103/PhysRevA.89.063404. | 2014 | Link |
| E. Barrier, F. M. B. Fernandes, M. Bujan, M. C. Feiters, A. Froideval, J. Ghijsen, T. Hase, M. A. Hough, M. Jergel, I. Jimenez, T. Kajander, A. Kikas, M. Kokkinidis, L. Kover, H. B. Larsen, D. M. Lawson, K. Lawniczak-Jablonska, C. Mariani, P. Mikulik, J. Monnier, S. Morera, C. McGuinness, P. Müller-Buschbaum, M. Meedom Nielson, U. Pietsch, M. Tromp, M. Simon, J. Stangl, G. Zanotti. The benefit of the European User Community from transnational access to national radiation facilities. J. Synchrotron Rad. 21, 638-639, Part: 3; DOI: 10.1107/S1600577514007619. | 2014 | Link |
| A. Biermanns , D. Carbone , S. Breuer , V. L. R. Jacques , T. Schulli , L. Geelhaar , U. Pietsch. Distribution of zinc-blende twins and wurtzite segments in GaAs nanowires probed by X-ray nanodiffraction. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume 7, Issue 10, Pages 860–863, Special Issue: SI; DOI: 10.1002/pssr.201307246. | 2013 | Link |
| E. Dimakis, M. Ramsteiner, C.-N. Huang, A. Trampert, A. Davydok, A. Biermanns, U. Pietsch, H. Riechert, L. Geelhaar. In situ doping of catalyst-free InAs nanowires with Si: Growth, polytypism, and local vibrational modes of Si. Appl. Phys. Lett. 103, Issue: 14, 143121, (2013). ; DOI: 10.1063/1.4824344 | 2013 | Link |
| B. Kaiser, A. Brand, M. Glässl, A. Vagov, V. M. Axt, U. Pietsch. Photoionization of resonantly driven atomic states by an extreme ultraviolet-free-electron laser: intensity dependence and renormalization of Rabi frequencies. New Journal of Physics, Volume 15, Article Number: 093016; DOI: 10.1088/1367-2630/15/9/093016. | 2013 | Link |
| S. Gorfman, O. Schmidt, V. Tsirelson, M. Ziolkowski, U. Pietsch. Crystallography under External Electric Field. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, Volume: 639, Issue: 11, Pages: 1953-1962, Special Issue: SI; DOI: 10.1002/zaac.201200497. | 2013 | Link |
| G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T. U. Schülli, A. D. Wieck, U. Pietsch. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. J Appl Crystallogr., 46 (Pt 4), 887–892; DOI: 10.1107/S0021889813004226. | 2013 | Link |
| A. Davydok, T. Rieger, A. Biermanns, M. Saqib, T. Grap, M. I. Lepsa, U. Pietsch. Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B. J Appl Crystallogr., 46(Pt 4), 893–897; DOI: 10.1107/S0021889813010522. | 2013 | Link |
| K. Ali, U. Pietsch, S. Grigorian. Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique. J. Appl. Cryst., 46, 908-911, Part: 4; DOI: 10.1107/S0021889813004718. | 2013 | Link |
| S. Send, A. Abboud, R. Hartmann, M. Huth, W. Leitenberger, N. Pashniak, J. Schmidt, L. Strüder, U. Pietsch. Characterization of a pnCCD for applications with synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Volume 711, Pages 132–142; DOI: 10.1016/j.nima.2013.01.044. | 2013 | Link |
| A. Abboud, S. Send, N. Pashniak, W. Leitenberger, S. Ihle, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Sub-pixel resolution of a pnCCD for X-ray white beam applications. Journal of Instrumentation, Volume 8, Article Number: P05005; DOI: 10.1088/1748-0221/8/05/P05005. | 2013 | Link |
| B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer, U. Pietsch. Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 46, Pages: 505-511, Part: 2; DOI: 10.1107/S0021889813004597. | 2013 | Link |
| A. Biermanns, T. Rieger, G. Bussone, U. Pietsch, D. Grützmacher, M. I. Lepsa. Axial strain in GaAs/InAs core-shell nanowires. Appl. Phys. Lett. 102, Issue: 4, 043109; DOI: 10.1063/1.4790185. | 2013 | Link |
| K. P. Kandel, U. Pietsch, Z. Li, Ö. K. Öztürk. Doping induced structural changes in colloidal semiconductor nanowires. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, Volume: 15, Issue: 12, Pages: 4444-4450; DOI: 10.1039/c3cp44500c. | 2013 | Link |
| B. Khanbabaee, B. Arezki, A. Biermanns, M. Cornejo, D. Hirsch, D. Lützenkirchen-Hecht, F. Frost, U. Pietsch. Depth profile investigation of the incorporated iron atoms during Kr+ ion beam sputtering on Si (001). THIN SOLID FILMS, Volume: 527, Pages: 349-353; DOI: 10.1016/j.tsf.2012.12.055. | 2013 | Link |
| M. Porro, L. Andricek, S. Aschauer, M. Bayer, J. Becker, L. Bombelli, A. Castoldi, G. De Vita, I. Diehl, F. Erdinger, S. Facchinetti, C. Fiorini, P. Fischer, T. Gerlach, H. Graafsma, C. Guazzoni, K. Hansen, P. Kalavakuru, H. Klär, A. Kugel, P. Lechner, M. Lemke, G. Lutz, M. Manghisoni, D. Mezza, D. Müntefering, U. Pietsch, E. Quartieri, M. Randall, V. Re, C. Reckleben, C. Sandow, J. Soldat, L. Strüder, J. Szymanski, G. Weidenspointner, C. B. Wunderer. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, Volume: 59, Issue: 6, Pages: 3339-3351, Part: 2; DOI: 10.1109/TNS.2012.2217755. | 2012 | Link |
| A. Habib, A. Shelke, M. Vogel, U. Pietsch, X. Jiang, T. Kundu. Mechanical characterization of sintered piezo-electric ceramic material using scanning acoustic microscope. Ultrasonics, Volume 52, Issue 8, Pages 989–995; DOI: 10.1016/j.ultras.2012.07.011. | 2012 | Link |
| L. Grodd, U. Pietsch, S. Grigorian. Direct Correlation Between Electric and Structural Properties During Solidification of Poly(3-hexylthiophene) Drop-Cast Films. MACROMOLECULAR RAPID COMMUNICATIONS, Volume: 33, Issue: 20, Pages: 1765-1769; DOI: 10.1002/marc.201200309. | 2012 | Link |
| B. Brüser, I. Staude, G. von Freymann, M. Wegener, U. Pietsch. Visible light Laue diffraction from woodpile photonic crystals. APPLIED OPTICS, Volume: 51, Issue: 28, Pages: 6732-6737; DOI: 10.1364/AO.51.006732. | 2012 | Link |
| T. W. Cornelius, A. Davydok, V. L. R. Jacques, R. Grifone, T. Schülli, M.-I. Richard, G. Beutier, M. Verdier, T. H. Metzger, U. Pietsch, O. Thomas. In situ three-dimensional reciprocal-space mapping during mechanical deformation. JOURNAL OF SYNCHROTRON RADIATION, Volume: 19, Pages: 688-694, Part: 5; DOI: 10.1107/S0909049512023758. | 2012 | Link |
| T. S. Shabi, S. Grigorian, M. Brinkmann, U. Pietsch, N. Koenen, N. Kayunkid, U. Scherf. Enhancement in crystallinity of poly(3-hexylthiophene) thin films prepared by low-temperature drop casting. JOURNAL OF APPLIED POLYMER SCIENCE, Volume: 125, Issue: 3, Pages: 2335-2341; DOI: 10.1002/app.36447. | 2012 | Link |
| A. Biermanns, S. Breuer, A. Trampert, A. Davydok, L. Geelhaar, U. Pietsch. Strain accommodation in Ga-assisted GaAs nanowires grown on silicon (111). Nanotechnology, Volume 23, Number 30, Article Number: 305703; DOI: 10.1088/0957-4484/23/30/305703. | 2012 | Link |
| A. Neuhold, J. Novák, H.-G. Flesch, A. Moser, T. Djuric, L. Grodd, S. Grigorian, U. Pietsch, R. Resel. X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Volume: 284, Pages: 64-68; DOI: 10.1016/j.nimb.2011.07.105. | 2012 | Link |
| S. T. Salammal, E. Mikayelyan, S. Grigorian, U. Pietsch , N. Koenen, U. Scherf , N. Kayunkid, M. Brinkmann. Impact of Thermal Annealing on the Semicrystalline Nanomorphology of Spin-Coated Thin Films of Regioregular Poly(3-alkylthiophene)s as Observed by High-Resolution Transmission Electron Microscopy and Grazing Incidence X-ray Diffraction. Macromolecules, 45 (13), pp 5575–5585; DOI: 10.1021/ma300906v. | 2012 | Link |
| A. Habib, A. Shelke, M. Pluta, T. Kundu, U. Pietsch, W. Grill. Imaging of Acoustic Waves in Piezoelectric Ceramics by Coulomb Coupling. Japanese Journal of Applied Physics, Volume: 51, Issue: 7, Part: 2, Special Issue: SI, Article Number: 07GB05; DOI: 10.1143/JJAP.51.07GB05. | 2012 | Link |
| S. Send, A. Abboud, W. Leitenberger, M. S. Weiss, R. Hartmann, L. Strüder, U. Pietsch. Analysis of polycrystallinity in hen egg-white lysozyme using a pnCCD. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 45, Pages: 517-522, Part: 3; DOI: 10.1107/S0021889812015038. | 2012 | Link |
| A. Biermanns, S. Breuer, A. Davydok, L. Geelhaar, U. Pietsch. Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 45, Pages: 239-244, Part: 2; DOI: 10.1107/S0021889812003007. | 2012 | Link |
| A. Davydok, S. Breuer, A. Biermanns, L. Geelhaar, U. Pietsch. Lattice parameter accommodation between GaAs(111) nanowires and Si(111) substrate after growth via Au-assisted molecular beam epitaxy. Nanoscale Research Letters, 7:109; DOI: 10.1186/1556-276X-7-109. | 2012 | Link |
| S. Grigorian, D. Tranchida, D. Ksenzov, F. Schäfers, H. Schönherr, U. Pietsch. Structural and morphological changes of P3HT films in the planar geometry of an OFET device under an applied electric field. European Polymer Journal, Volume 47, Issue 12, Pages 2189–2196; DOI: 10.1016/j.eurpolymj.2011.09.003. | 2011 | Link |
| A. Abboud, S. Send, R. Hartmann, L. Strüder, A. Savan, A. Ludwig, N. Zotov, U. Pietsch. Applications of an energy-dispersive pnCCD for X-ray reflectivity: Investigation of interdiffusion in Fe-Pt multilayers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume 208, Issue 11, Pages 2601–2607; DOI: 10.1002/pssa.201184268. | 2011 | Link |
| A. Biermanns, A. Hanisch, J. Grenzer, T. H. Metzger, U. Pietsch. Tuning the shape and damage in ion-beam induced ripples on silicon. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 208, Issue: 11, Pages: 2608-2611; DOI: 10.1002/pssa.201184269. | 2011 | Link |
| B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Ultrafast photoionization dynamics at high laser intensities in the xuv regime. PHYSICAL REVIEW A, Volume: 84, Issue: 4, Article Number: 043431; DOI: 10.1103/PhysRevA.84.043431. | 2011 | Link |
| D. Ksenzov, C. Schlemper, A. Davtyan, S. Bajt, F. Schäfers, U. Pietsch. A setup for probing ultra-short soft X-ray diffraction by means of curved multilayer structures. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 269, Issue 19, Pages 2124–2129; DOI: 10.1016/j.nimb.2011.07.002. | 2011 | Link |
| A. Biermanns, S. Breuer, A. Davydok, L. Geelhaar, U. Pietsch. Structural evolution of self-assisted GaAs nanowires grown on Si(111). PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 5, Issue: 4, Pages: 156-158; DOI: 10.1002/pssr.201105055. | 2011 | Link |
| B. Arezki, G. Schwarz, Y. Bodenthin, D. Luetzenkirchen-Hecht, C. Markert, R. Wagner, R. Frahm, D. G. Kurth, U. Pietsch. X-Ray Near-Edge Absorption Study of Temperature-Induced Low-Spin-to-High-Spin Change in Metallo-Supramolecular Assemblies. CHEMPHYSCHEM, Volume:12, Issue: 2, Pages: 405-410; DOI: 10.1002/cphc.201000428. | 2011 | Link |
| G. Schwarz, Y. Bodenthin, Z. Tomkowicz, W. Haase, T. Geue, J. Kohlbrecher, U. Pietsch, D. G. Kurth. Tuning the Structure and the Magnetic Properties of Metallo-supramolecular Polyelectrolyte-Amphiphile Complexes. J. Am. Chem. Soc., 133 (3), pp 547–558; DOI: 10.1021/ja108416a. | 2011 | Link |
| T. Sant, T. Panzner, U. Pietsch. Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity. APPLIED SURFACE SCIENCE, Volume: 257, Issue: 1, Pages: 266-270; DOI: 10.1016/j.apsusc.2010.06.083. | 2010 | Link |
| P. Huber, O. Bunk, U. Pietsch, M. Textor, T. Geue. Grazing Incidence Small Angle X-ray Scattering on Colloidal Crystals. JOURNAL OF PHYSICAL CHEMISTRY B, Volume: 114, Issue: 39, Pages: 12473-12479; DOI: 10.1021/jp103943y. | 2010 | Link |
| S. Gorfman, O. Schmidt, M. Ziolkowski, M. von Kozierowski, U. Pietsch. Time-resolved x-ray diffraction study of the piezoelectric crystal response to a fast change of an applied electric field. JOURNAL OF APPLIED PHYSICS, Volume: 108, Issue: 6, Article Number: 064911; DOI: 10.1063/1.3480996. | 2010 | Link |
| D. Ksenzov, C. Schlemper, U. Pietsch. Resonant soft x-ray reflectivity of Me/B4C multilayers near the boron K edge. APPLIED OPTICS, Volume: 49, Issue: 25, Pages: 4767-4773; DOI: 10.1364/AO.49.004767. | 2010 | Link |
| U. Pietsch, M. J. Cooper. European Synchrotron User Organization established. JOURNAL OF SYNCHROTRON RADIATION, Volume: 17, Pages: 428-429, Part: 3; DOI: 10.1107/S0909049510010484. | 2010 | Link |
| A. Davydok, A. Biermanns, U. Pietsch, J. Grenzer, H. Paetzelt, V. Gottschalch. X-Ray Diffraction from Periodically Patterned GaAs Nanorods Grown onto GaAs[111]B. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, Volume: 41A, Issue: 5, Pages: 1191-1195; DOI: 10.1007/s11661-009-9868-3. | 2010 | Link |
| A. Hanisch, A. Biermanns, J. Grenzer, S. Facsko, U. Pietsch. Xe ion beam induced rippled structures on differently oriented single-crystalline Si surfaces. JOURNAL OF PHYSICS D-APPLIED PHYSICS, Volume: 43, Issue: 11, Article Number: 112001; DOI: 10.1088/0022-3727/43/11/112001. | 2010 | Link |
| L. Strüder, S. Epp, D. Rolles, R. Hartmann, P. Holl, G. Lutz, H. Soltau, R. Eckart, C. Reich, K. Heinzinger, C. Thamm, A. Rudenko, F. Krasniqi, K.-U. Kühnel, C. Bauer, C.-D. Schröter, R. Moshammer, S. Techert, D. Miessner, M. Porro, O. Hälker, N. Meidinger, N. Kimmel, R. Andritschke, F. Schopper, G. Weidenspointner, A. Ziegler, D. Pietschner, S. Herrmann, U. Pietsch, A. Walenta, W. Leitenberger, C. Bostedt, T. Möller, D. Rupp, M. Adolph, H. Graafsma, H. Hirsemann, K. Gärtner, R. Richter, L. Foucar, R. L. Shoeman, I. Schlichting, J. Ullrich. Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Volume: 614, Issue: 3, Pages: 483-496; DOI: 10.1016/j.nima.2009.12.053. | 2010 | Link |
| M. Wiatrowski, E. Dobruchowska, W. Maniukiewicz, U. Pietsch, J. Kowalski, Z. Szamel, J. Ulanski. Self-assembly of perylenediimide based semiconductor on polymer substrate. THIN SOLID FILMS, Volume: 518, Issue: 8, Pages: 2266-2270; DOI: 10.1016/j.tsf.2009.08.037. | 2010 | Link |
| D. Ksenzov, T. Panzner, C. Schlemper, C. Morawe, U. Pietsch. Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer. APPLIED OPTICS, Volume: 48, Issue: 35, Pages: 6684-6691; DOI: 10.1364/AO.48.006684. | 2009 | Link |
| S. Send, M. von Kozierowski, T. Panzner, S. Gorfman, K. Nurdan, A. H. Walenta, U. Pietsch, W. Leitenberger, R. Hartmann, L. Strüder. Energy-dispersive Laue diffraction by means of a frame-store pnCCD. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 42, Pages: 1139-1146, Part: 6; DOI: 10.1107/S0021889809039867. | 2009 | Link |
| M. Bulatov, V. Rusakov, U. Pietsch, T. Panzner. Structure and Magnetic Characteristics of Metal-Polymeric Nanocomposites with Different Fe and Ni Concentrations on the Basis of Polyacrylonitrile. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, Volume: 4, Issue: 3, Pages: 325-328; DOI: 10.1166/jno.2009.1048. | 2009 | Link |
| Z. Li, Ö. Kurtulus, N. Fu, Z. Wang, A. Kornowski, U. Pietsch, A. Mews. Controlled Synthesis of CdSe Nanowires by Solution-Liquid-Solid Method. ADVANCED FUNCTIONAL MATERIALS, Volume: 19, Issue: 22, Pages: 3650-3661; DOI: 10.1002/adfm.200900569. | 2009 | Link |
| A. Biermanns, A. Davydok, H. Paetzelt, A. Diaz, V. Gottschalch, T. H. Metzger, U. Pietsch. Individual GaAs nanorods imaged by coherent X-ray diffraction. JOURNAL OF SYNCHROTRON RADIATION, Volume: 16, Pages: 796-802, Part: 6; DOI: 10.1107/S0909049509032889 | 2009 | Link |
| Y. Bodenthin, G. Schwarz, Z. Tomkowicz, M. Lommel, T. Geue, W. Haase, H. Möhwald, U. Pietsch, D. G. Kurth. Spin-crossover phenomena in extended multi-component metallo-supramolecular assemblies. COORDINATION CHEMISTRY REVIEWS, Volume: 253, Issue: 19-20, Pages: 2414-2422; DOI: 10.1016/j.ccr.2008.10.019. | 2009 | Link |
| J. Bauer, U. Pietsch, A. Davydok, A. Biermanns, J. Grenzer, V. Gottschalch, G. Wagner. X-ray investigation of the interface structure of free standing InAs nanowires grown on GaAs [(1)over-bar(1)over-bar(1)over-bar](B). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. Volume: 96, Issue: 4, Pages: 851-859; DOI: 10.1007/s00339-009-5318-8. | 2009 | Link |
| A. Davydok, A. Biermanns, U. Pietsch, J. Grenzer, H. Paetzelt, V. Gottschalch, J. Bauer. Submicron resolution X-ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1704-1708, Special Issue: SI; DOI: 10.1002/pssa.200881586. | 2009 | Link |
| J. Grenzer, A. Biermanns, A. Mücklich, S. A. Grigorian, U. Pietsch. Ripple structures on surfaces and underlying crystalline layers in ion beam irradiated Si wafers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1731-1735; DOI: 10.1002/pssa.200881589. | 2009 | Link |
| Ö. Kurtuluş, Z. Li, A. Mews, U. Pietsch. X-ray investigation of CdSe nanowires. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1752-1756; DOI: 10.1002/pssa.200881614. | 2009 | Link |
| D. Ksenzov, S. Grigorian, S. Hendel, F. Bienert, M. D. Sacher, U. Heinzmann, U. Pietsch. Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Volume: 206, Issue: 8, Pages: 1875-1879; DOI: 10.1002/pssa.200881585. | 2009 | Link |
| S. Joshi, P. Pingel, S. Grigorian, T. Panzner, U. Pietsch, D. Neher, M. Forster, U. Scherf. Bimodal Temperature Behavior of Structure and Mobility in High Molecular Weight P3HT Thin Films. MACROMOLECULES, Volume: 42, Issue: 13, Pages: 4651-4660; DOI: 10.1021/ma900021w. | 2009 | Link |
| O. Schmidt, S. Gorfman, L. Bohatý, E. Neumann, B. Engelen, U. Pietsch. Investigations of the bond-selective response in a piezoelectric Li2SO4 center dot H2O crystal to an applied external electric field. ACTA CRYSTALLOGRAPHICA SECTION A, Volume: 65, Pages: 267-275, Part: 4; DOI: 10.1107/S0108767309015566. | 2009 | Link |
| P. U. Veer, U. Pietsch, M. Saphiannikova. Time and temperature dependence of surface relief grating formation in polymers containing azobenzene groups with different dipole moment. JOURNAL OF APPLIED PHYSICS, Volume: 106, Issue: 1, Article Number: 014909; DOI: 10.1063/1.3159652. | 2009 | Link |
| P. U. Veer, U. Pietsch, A. D. Mueller. Alteration of the mechanical properties of azopolymer film in the process of surface relief grating formation. APPLIED PHYSICS LETTERS, Volume: 94, Issue: 23, Article Number: 231911; DOI: 10.1063/1.3153847. | 2009 | Link |
| D. Carbone, A. Biermanns, B. Ziberi, F. Frost, O. Plantevin, U. Pietsch, T. H. Metzger. Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques. JOURNAL OF PHYSICS-CONDENSED MATTER, Volume: 21, Issue: 22, Article Number: 224007; DOI: 10.1088/0953-8984/21/22/224007. | 2009 | Link |
| V. R. Reddy, A. Gupta, A. Gome, W. Leitenberger, U. Pietsch. In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L1(0) ordering in Fe-57/Pt multilayers. JOURNAL OF PHYSICS-CONDENSED MATTER, Volume: 21, Issue: 18, Article Number: 186002; DOI: 10.1088/0953-8984/21/18/186002. | 2009 | Link |
| Y. Bodenthin, G. Schwarz, Z. Tomkowicz, T. Geue, W. Haase, U. Pietsch, D. G. Kurth. Liquid Crystalline Phase Transition Induces Spin Crossover in a Polyelectrolyte Amphiphile Complex. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, Volume: 131, Issue: 8, Pages: 2934-2941; DOI: 10.1021/ja808278s. | 2009 | Link |
| B. Reinhold, T. Geue, P. Huber, T. Sant, U. Pietsch, M. Sztucki. In Situ and Ex Situ SAXS Investigation of Colloidal Sedimentation onto Laterally Patterned Support. LANGMUIR, Volume: 25, Issue: 2, Pages: 814-819; DOI: 10.1021/la803078b. | 2009 | Link |
