| Subject | Year | Link |
| B. Dönges, K. Istomin, M. Söker, N. Schell, U. Krupp, U. Pietsch, C.-P. Fritzen, H.-J. Christ. Experimental investigation and numerical description of the damage evolution in a duplex stainless steel subjected to VHCF-loading. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, Volume 646, Pages 8–18; DOI: 10.1016/j.msea.2015.08.021. | 2015 | Link |
| A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Model study on how an ordered grouping of atoms affects their inner-shell photoionization. Phys. Rev. A 92, Issue: 3, Article Number: 033424; DOI: 10.1103/PhysRevA.92.033424 | 2015 | Link |
| U. Krupp, A. Giertler, M. Söker, H. Fu, B. Dönges, H.-J. Christ, A. Hüsecken, U. Pietsch, C.-P. Fritzen, W. Ludwig. The behavior of short fatigue cracks during Very High Cycle (VHCF) Fatigue of duplex stainless steel. Engineering Fracture Mechanics, Volume 145, Pages 197–209; DOI: 10.1016/j.engfracmech.2015.03.024. | 2015 | Link |
| A. Habib, A. Shelke, M. Vogel, S. Brand, X. Jiang, U. Pietsch, S. Banerjee, T. Kundu. Quantitative Ultrasonic Characterization of c-Axis Oriented Polycrystalline AlN Thin Film for Smart Device Application. Acta acustica united with Acustica 101, No.4, pp.675-683; DOI: 10.3813/AAA.918863. | 2015 | Link |
| S. T. Salammal, S. Dai, U. Pietsch, S. Grigorian, N. Koenen, U. Scherf, N. Kayunkid, M. Brinkmann. Influence of alkyl side chain length on the in-plane stacking of room temperature and low temperature cast poly(3-alkylthiophene) thin films. European Polymer Journal, Volume 67, Pages 199–212; DOI: 10.1016/j.eurpolymj.2015.03.065. | 2015 | Link |
| H. Choe, S. Gorfman, M. Hinterstein, M. Ziolkowski, M. Knapp, S. Heidbrink, M. Vogt, J. Bednarcik, A. Berghäuser, H. Ehrenberg, U. Pietsch. Combining high time and angular resolutions: time-resolved X-ray powder diffraction using a multi-channel analyser detector. J. Appl. Cryst. 48, 970-974, Part: 3; DOI: 10.1107/S1600576715004598. | 2015 | Link |
| S. Gorfman, H. Choe, V. V. Shvartsman, M. Ziolkowski, M. Vogt, J. Strempfer, T. Łukasiewicz, U. Pietsch, J. Dec. Time-Resolved X-Ray Diffraction Reveals the Hidden Mechanism of High Piezoelectric Activity in a Uniaxial Ferroelectric. Phys. Rev. Lett. 114, Issue: 9, Article Number: 097601; DOI: 10.1103/PhysRevLett.114.097601. | 2015 | Link |
| P. Schroth, M. Köhl, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, A. Biermanns, S. Bauer, S. Lazarev, U. Pietsch, T. Baumbach. Evolution of Polytypism in GaAs Nanowires during Growth Revealed by Time-Resolved in situ x-ray Diffraction. Phys. Rev. Lett. 114, Issue: 5, Article Number: 055504; DOI: 10.1103/PhysRevLett.114.055504. | 2015 | Link |
| G. Bussone, H. Schäfer-Eberwein, E. Dimakis, A. Biermanns, D. Carbone, A. Tahraoui, L. Geelhaar, P. H. Bolívar, T. U. Schülli, U. Pietsch. Correlation of Electrical and Structural Properties of Single As-Grown GaAs Nanowires on Si (111) Substrates. Nano Lett., 15 (2), pp 981–989; DOI: 10.1021/nl5037879. | 2015 | Link |
| M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch, T. Baumbach. Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction. JOURNAL OF SYNCHROTRON RADIATION, Volume 22, Part 1, Pages 67-75; DOI: 10.1107/S1600577514023480. | 2015 | Link |
| A. Davtyan, A. Biermanns, O. Loffeld, U. Pietsch. Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging. New Journal of Physics, Volume 18, Article Number: 063021, DOI: 10.1088/1367-2630/18/6/063021. | 2016 | Link |
| I. M. Fodchuk, I. I. Gutsuliak, V. V. Dovganiuk, A. O. Kotsyubynskiy, U. Pietsch, N. V. Pashniak, O. Yu. Bonchyk, I. M. Syvorotka, P. M. Lytvyn. Magnetic and structural changes in the near-surface epitaxial Y2.95La0.05Fe5O12 films after high-dose ion implantation. Applied Optics Vol. 55, Issue 12, pp. B144-B149; DOI: 10.1364/AO.55.00B144. | 2016 | Link |
| S. Gorfman, H. Simons, T. Iamsasri, S. Prasertpalichat, D. P. Cann, H. Choe, U. Pietsch, Y. Watier, J. L. Jones. Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics. Scientific Reports 6, Article number: 20829; DOI: 10.1038/srep20829. | 2016 | Link |
| S. Send, A. Abboud, N. Wiesner, M. Shokr, M. Klaus, C. Genzel, T. Conka-Nurdan, D. Schlosser, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays. J. Appl. Cryst. 49, 222-233, Part 1; DOI: 10.1107/S1600576715023997. | 2016 | Link |
| A. Seel, A. Davtyan, U. Pietsch, O. Loffeld. Norm minimized Scattering Data from Intensity Spectra. MATHEMATICAL PROBLEMS IN ENGINEERING, Article Number: 9853714; DOI: 10.1155/2016/9853714. | 2016 | Link |
| F. Alghabi, S. Send, U. Schipper, A. Abboud, U. Pietsch, A. Kolb. Fast GPU-based absolute intensity determination for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 11, Article Number: T01001; DOI: 10.1088/1748-0221/11/01/T01001. | 2016 | Link |
| J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, U. Pietsch, H. Ryll, S. Send, M. Simson, H. Soltau, J. Soltau, D. Steigenhöfer, L. Strüder. Controlled charge extraction - antiblooming capabilities in pnCCD imaging sensors. Journal of Instrumentation, Volume 11, Article Number: P01012; DOI: 10.1088/1748-0221/11/01/P01012. | 2016 | Link |
| D. M. Schlosser, M. Huth, R. Hartmann, A. Abboud, S. Send, T. Conka-Nurdan, M. Shokr, U. Pietsch, L. Strüder. Direct and indirect signal detection of 122 keV photons with a novel detector combining a pnCCD and a CsI(Tl) scintillator. Nuclear Inst. and Methods in Physics Research, A, Volume 805, p. 55-62, Special Issue: SI; DOI: 10.1016/j.nima.2015.08.065. | 2016 | Link |
