"Ultimate Sensitivity in X-ray Diffraction: Angular Moments vs. Shot
Noise", Peter Modregger, Felix Wittwer, Ahmar Khaliq, Niklas Pyrlik,
James A. D. Ball, Jan Garrevoet, Gerald Falkenberg, Alexander Liehr, Michael
Stuckelberger, Journal of Applied Crystallography (2024), submitted, arxiv.org/abs/2502.17977
"Texture tomography with high angular resolution
utilizing sparsity", Mads Carlsen, Florencia Malamud,
Peter Modregger, Anna Wildeis, Markus Hartmann, Robert
Brandt, Andreas Menzel, and Marianne Liebi, Journal of
Applied Crystallography 58 (2025), dx.doi.org/10.1107/S1600576725001426
"Annular x-ray optics offer superior resolution for
radiation sensitive samples", Felix Wittwer, Peter
Modregger, J. Phys.: Conf. (2025), accepted, arxiv.org/abs/2409.00166
"Parallax in angular sensitive powder diffraction
tomography", Peter Modregger, Ahmar Khaliq, Felix Wittwer,
J. Phys.: Conf. (2025), accepted, arxiv.org/abs/2409.00157
"Measurements of dislocations in 4H-SiC with rocking
curve imaging" Ahmar Khaliq, Felix Wittwer, Niklas Pyrlik,
Giovanni Fevola, Svenja Patjens, Jackson Barp, Gero
Falkenberg, Sven Hampel, Michael Stuckelberger, Jan
Garrevoet, Dennis Bruckner, Peter Modregger , J. Phys.:
Conf. (2025), accepted, arxiv.org/abs/2409.00200
2024
"Multi-contrast x-ray identification of inhomogeneous
materials and their discrimination through deep learning
approaches", Tom Partridge, Sukrit Shankar, Ian Buchanan,
Peter Modregger, Alberto Astolfo, David Bate, and
Alessandro Olivo, Optica 11, 759-767
(2024), doi.org/10.1364/OPTICA.507049
"Calibration of scanning acoustic microscopy for the
differentiation between unstable and stable atherosclerotic
plaques by X-ray fluorescence imaging", Peter Modregger,
Mallika Khosla, Prerana Chakrabarti, Özgül Öztürk, Kathryn
Spiers, Mehmet Burcin Unlu, and Bükem Tanören, Radiation
Physics and Chemistry 224, 112058 (2024),
doi.org/10.1016/j.radphyschem.2024.112058
2023
"Object Initialization For Ptychographic Scans With
Reduced Overlap", Felix Wittwer and Peter Modregger, AIP
Conf Series 2990, 040005 (2023),
doi.org/10.1063/5.0168255
"Increased material differentiation through
multi-contrast x-ray imaging: a preliminary evaluation of
potential applications to the detection of threat
materials:, Alberto Astolfo, Ian G. Haig, D. Bate,
Alesandro Olivo and Peter Modregger, Physica Scripta
98, 095501 (2023), doi.org/10.1088/1402-4896/ace939
"Defect detection in glass fiber reinforced
thermoplastics by laboratory-based X-ray scattering", Özgül
Oztürk, Rolf Brönnimann, and Peter Modregger, Composites
part B: Engineering 252,
110502 (2023), doi.org/10.1016/j.compositesb.2023.110502
2022
"The diffraction volume for square-shaped samples in
X-ray diffraction with high spatial resolution", Prerana
Chakrabarti and Peter Modregger, Journal of Physics:
Conference Series, 2380, 012132
(2022), doi.org/10.1088/1742-6596/2380/1/012132
"X-ray diffraction with micrometer spatial resolution
for highly absorbing samples", Prerana Chakrabarti, Anna
Wildeis, Markus Hartmann, Robert Brandt, Ralph Döhrmann,
Giovanni Fevola, Christina Ossig, Michael Elias
Stuckelberger, Jan Garrevoet, Ken Vidar Falch, Vanessa
Galbierz, Gerald Falkenberg, and Peter Modregger, Journal
of Synchrotron Radiation 29,
1407-1413 (2022), doi.org/10.1107/S1600577522008025
"Ptychographic reconstruction with object
initialization", Felix Wittwer, Dennis Brückner, and Peter
Modregger, Optics Express 30, 33652
(2022), doi.org/10.1364/OE.465397
