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Publications 2013 - 2014

Subject Year Link
A. Biermanns , D. Carbone , S. Breuer , V. L. R. Jacques , T. Schulli , L. Geelhaar , U. Pietsch. Distribution of zinc-blende twins and wurtzite segments in GaAs nanowires probed by X-ray nanodiffraction. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume 7, Issue 10, Pages 860–863, Special Issue: SI; DOI: 10.1002/pssr.201307246. 2013 Link
E. Dimakis, M. Ramsteiner, C.-N. Huang, A. Trampert, A. Davydok, A. Biermanns, U. Pietsch, H. Riechert, L. Geelhaar. In situ doping of catalyst-free InAs nanowires with Si: Growth, polytypism, and local vibrational modes of Si. Appl. Phys. Lett. 103, Issue: 14, 143121, (2013). ; DOI: 10.1063/1.4824344 2013 Link
B. Kaiser, A. Brand, M. Glässl, A. Vagov, V. M. Axt, U. Pietsch. Photoionization of resonantly driven atomic states by an extreme ultraviolet-free-electron laser: intensity dependence and renormalization of Rabi frequencies. New Journal of Physics, Volume 15, Article Number: 093016; DOI: 10.1088/1367-2630/15/9/093016. 2013 Link
S. Gorfman, O. Schmidt, V. Tsirelson, M. Ziolkowski, U. Pietsch. Crystallography under External Electric Field. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, Volume: 639, Issue: 11, Pages: 1953-1962, Special Issue: SI; DOI: 10.1002/zaac.201200497. 2013 Link
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T. U. Schülli, A. D. Wieck, U. Pietsch. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. J Appl Crystallogr., 46 (Pt 4), 887–892; DOI: 10.1107/S0021889813004226. 2013 Link
A. Davydok, T. Rieger, A. Biermanns, M. Saqib, T. Grap, M. I. Lepsa, U. Pietsch. Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B. J Appl Crystallogr., 46(Pt 4), 893–897; DOI: 10.1107/S0021889813010522. 2013 Link
K. Ali, U. Pietsch, S. Grigorian. Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique. J. Appl. Cryst., 46, 908-911, Part: 4; DOI: 10.1107/S0021889813004718. 2013 Link
S. Send, A. Abboud, R. Hartmann, M. Huth, W. Leitenberger, N. Pashniak, J. Schmidt, L. Strüder, U. Pietsch. Characterization of a pnCCD for applications with synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Volume 711, Pages 132–142; DOI: 10.1016/j.nima.2013.01.044. 2013 Link
A. Abboud, S. Send, N. Pashniak, W. Leitenberger, S. Ihle, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Sub-pixel resolution of a pnCCD for X-ray white beam applications. Journal of Instrumentation, Volume 8, Article Number: P05005; DOI: 10.1088/1748-0221/8/05/P05005. 2013 Link
B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer, U. Pietsch. Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 46, Pages: 505-511, Part: 2; DOI: 10.1107/S0021889813004597. 2013 Link
A. Biermanns, T. Rieger, G. Bussone, U. Pietsch, D. Grützmacher, M. I. Lepsa. Axial strain in GaAs/InAs core-shell nanowires. Appl. Phys. Lett. 102, Issue: 4, 043109; DOI: 10.1063/1.4790185. 2013 Link
K. P. Kandel, U. Pietsch, Z. Li, Ö. K. Öztürk. Doping induced structural changes in colloidal semiconductor nanowires. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, Volume: 15, Issue: 12, Pages: 4444-4450; DOI: 10.1039/c3cp44500c. 2013 Link
B. Khanbabaee, B. Arezki, A. Biermanns, M. Cornejo, D. Hirsch, D. Lützenkirchen-Hecht, F. Frost, U. Pietsch. Depth profile investigation of the incorporated iron atoms during Kr+ ion beam sputtering on Si (001). THIN SOLID FILMS, Volume: 527, Pages: 349-353; DOI: 10.1016/j.tsf.2012.12.055. 2013 Link
C. Somaschini, A. Biermanns, S. Bietti, G. Bussone, A. Trampert, S. Sanguinetti, H. Riechert, U. Pietsch, L. Geelhaar. Axial InAs/GaAs heterostructures on silicon in a nanowire geometry. Nanotechnology, Volume 25, Number 48, Article Number: 485602; DOI: 10.1088/0957-4484/25/48/485602. 2014 Link
A. Biermanns, E. Dimakis, A. Davydok, T. Sasaki, L. Geelhaar, M. Takahasi, U. Pietsch. Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111). Nano Lett., 14(12), pp 6878–6883; DOI: 10.1021/nl502878a. 2014 Link
G. Bussone, E. Dimakis, R. Grifone, A. Biermanns, A. Tahraoui, D. Carbone, L. Geelhaar, T. U. Schülli, U. Pietsch. Impact of strain induced by polymer curing in benzocyclobutene embedded semiconductor nanostructures. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 8, Issue: 12, Pages: 1007-1010; DOI: 10.1002/pssr.201409346. 2014 Link
A. Leonov, D. Ksenzov, A. Benediktovitch, I. Feranchuk, U. Pietsch. Time dependence of X-ray polarizability of a crystal induced by an intense femtosecond X-ray pulse. IUCRJ, Volume: 1, Pages: 402-417, Part: 6; DOI: 10.1107/S2052252514018156. 2014 Link
A. Abboud, C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strüder, J. Keckes, U. Pietsch. A new method for polychromatic X-ray mu Laue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Rev. Sci. Instrum. 85, Issue: 11, Article Number: 113901; DOI: 10.1063/1.4900482. 2014 Link
F. Alghabi, S. Send, U. Schipper, A. Abboud, N. Pashniak, U. Pietsch, A. Kolb. Fast GPU-based spot extraction for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 9, Article Number: T11003; DOI: 10.1088/1748-0221/9/11/T11003. 2014 Link
B. Khanbabaee, S. Facsko, S. Doyle, U. Pietsch. Near-surface density profiling of Fe ion irradiated Si(100) using extremely asymmetric x-ray diffraction by variation of the wavelength. Appl. Phys. Lett. 105, Issue: 16, 163101; DOI: 10.1063/1.4899068. 2014 Link
T. Rieger, T. Jörres, J. Vogel, A. Biermanns, U. Pietsch, D. Grützmacher, M. I. Lepsa. Crystallization of HfO2 in InAs/HfO2 core-shell nanowires. Nanotechnology, Volume 25, Number 40, Article Number: 405701; DOI: 10.1088/0957-4484/25/40/405701. 2014 Link
K. Istomin, B. Dönges, N. Schell, H.-J. Christ, U. Pietsch. Analysis of VHCF damage in a duplex stainless steel using hard X-ray diffraction techniques. International Journal of Fatigue, Volume 66, Pages 177–182; DOI: 10.1016/j.ijfatigue.2014.04.001. 2014 Link
B. Khanbabaee, D. Lützenkirchen-Hecht, R. Hübner, J. Grenzer, S. Facsko, U. Pietsch. Near surface silicide formation after off-normal Fe-implantation of Si (001) surfaces. JOURNAL OF APPLIED PHYSICS, Volume: 116, Issue: 2, Article Number: 024301; DOI: 10.1063/1.4887516. 2014 Link
C. Gutt, L. Grodd, E. Mikayelyan, U. Pietsch, R. J. Kline, S. Grigorian. Local Orientational Structure of a P3HT pi-pi Conjugated Network Investigated by X-ray Nanodiffraction. JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 5(13), pp 2335–2339; DOI: 10.1021/jz500757p. 2014 Link
D. Lützenkirchen-Hecht, R. Wagner, S. Szillat, A. K. Hüsecken, K. Istomin, U. Pietsch, R. Frahm. The multi-purpose hard X-ray beamline BL10 at the DELTA storage ring. J. Synchrotron Rad., 21, 819-826, Part: 4; DOI: 10.1107/S1600577514006705. 2014 Link
A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Non-Markovian behavior of ultrafast coherent ionization dynamics in a crystal exposed to a seeded free-electron-laser pulse. PHYSICAL REVIEW A, Volume: 89, Issue: 6, Article Number: 063404; DOI: 10.1103/PhysRevA.89.063404. 2014 Link
E. Barrier, F. M. B. Fernandes, M. Bujan, M. C. Feiters, A. Froideval, J. Ghijsen, T. Hase, M. A. Hough, M. Jergel, I. Jimenez, T. Kajander, A. Kikas, M. Kokkinidis, L. Kover, H. B. Larsen, D. M. Lawson, K. Lawniczak-Jablonska, C. Mariani, P. Mikulik, J. Monnier, S. Morera, C. McGuinness, P. Müller-Buschbaum, M. Meedom Nielson, U. Pietsch, M. Tromp, M. Simon, J. Stangl, G. Zanotti. The benefit of the European User Community from transnational access to national radiation facilities. J. Synchrotron Rad. 21, 638-639, Part: 3; DOI: 10.1107/S1600577514007619. 2014 Link