Subject | Year | Link |
A. Biermanns , D. Carbone , S. Breuer , V. L. R. Jacques , T. Schulli , L. Geelhaar , U. Pietsch. Distribution of zinc-blende twins and wurtzite segments in GaAs nanowires probed by X-ray nanodiffraction. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume 7, Issue 10, Pages 860–863, Special Issue: SI; DOI: 10.1002/pssr.201307246. | 2013 | Link |
E. Dimakis, M. Ramsteiner, C.-N. Huang, A. Trampert, A. Davydok, A. Biermanns, U. Pietsch, H. Riechert, L. Geelhaar. In situ doping of catalyst-free InAs nanowires with Si: Growth, polytypism, and local vibrational modes of Si. Appl. Phys. Lett. 103, Issue: 14, 143121, (2013). ; DOI: 10.1063/1.4824344 | 2013 | Link |
B. Kaiser, A. Brand, M. Glässl, A. Vagov, V. M. Axt, U. Pietsch. Photoionization of resonantly driven atomic states by an extreme ultraviolet-free-electron laser: intensity dependence and renormalization of Rabi frequencies. New Journal of Physics, Volume 15, Article Number: 093016; DOI: 10.1088/1367-2630/15/9/093016. | 2013 | Link |
S. Gorfman, O. Schmidt, V. Tsirelson, M. Ziolkowski, U. Pietsch. Crystallography under External Electric Field. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, Volume: 639, Issue: 11, Pages: 1953-1962, Special Issue: SI; DOI: 10.1002/zaac.201200497. | 2013 | Link |
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T. U. Schülli, A. D. Wieck, U. Pietsch. Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. J Appl Crystallogr., 46 (Pt 4), 887–892; DOI: 10.1107/S0021889813004226. | 2013 | Link |
A. Davydok, T. Rieger, A. Biermanns, M. Saqib, T. Grap, M. I. Lepsa, U. Pietsch. Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B. J Appl Crystallogr., 46(Pt 4), 893–897; DOI: 10.1107/S0021889813010522. | 2013 | Link |
K. Ali, U. Pietsch, S. Grigorian. Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique. J. Appl. Cryst., 46, 908-911, Part: 4; DOI: 10.1107/S0021889813004718. | 2013 | Link |
S. Send, A. Abboud, R. Hartmann, M. Huth, W. Leitenberger, N. Pashniak, J. Schmidt, L. Strüder, U. Pietsch. Characterization of a pnCCD for applications with synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Volume 711, Pages 132–142; DOI: 10.1016/j.nima.2013.01.044. | 2013 | Link |
A. Abboud, S. Send, N. Pashniak, W. Leitenberger, S. Ihle, M. Huth, R. Hartmann, L. Strüder, U. Pietsch. Sub-pixel resolution of a pnCCD for X-ray white beam applications. Journal of Instrumentation, Volume 8, Article Number: P05005; DOI: 10.1088/1748-0221/8/05/P05005. | 2013 | Link |
B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer, U. Pietsch. Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction. JOURNAL OF APPLIED CRYSTALLOGRAPHY, Volume: 46, Pages: 505-511, Part: 2; DOI: 10.1107/S0021889813004597. | 2013 | Link |
A. Biermanns, T. Rieger, G. Bussone, U. Pietsch, D. Grützmacher, M. I. Lepsa. Axial strain in GaAs/InAs core-shell nanowires. Appl. Phys. Lett. 102, Issue: 4, 043109; DOI: 10.1063/1.4790185. | 2013 | Link |
K. P. Kandel, U. Pietsch, Z. Li, Ö. K. Öztürk. Doping induced structural changes in colloidal semiconductor nanowires. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, Volume: 15, Issue: 12, Pages: 4444-4450; DOI: 10.1039/c3cp44500c. | 2013 | Link |
B. Khanbabaee, B. Arezki, A. Biermanns, M. Cornejo, D. Hirsch, D. Lützenkirchen-Hecht, F. Frost, U. Pietsch. Depth profile investigation of the incorporated iron atoms during Kr+ ion beam sputtering on Si (001). THIN SOLID FILMS, Volume: 527, Pages: 349-353; DOI: 10.1016/j.tsf.2012.12.055. | 2013 | Link |
C. Somaschini, A. Biermanns, S. Bietti, G. Bussone, A. Trampert, S. Sanguinetti, H. Riechert, U. Pietsch, L. Geelhaar. Axial InAs/GaAs heterostructures on silicon in a nanowire geometry. Nanotechnology, Volume 25, Number 48, Article Number: 485602; DOI: 10.1088/0957-4484/25/48/485602. | 2014 | Link |
A. Biermanns, E. Dimakis, A. Davydok, T. Sasaki, L. Geelhaar, M. Takahasi, U. Pietsch. Role of Liquid Indium in the Structural Purity of Wurtzite InAs Nanowires That Grow on Si(111). Nano Lett., 14(12), pp 6878–6883; DOI: 10.1021/nl502878a. | 2014 | Link |
G. Bussone, E. Dimakis, R. Grifone, A. Biermanns, A. Tahraoui, D. Carbone, L. Geelhaar, T. U. Schülli, U. Pietsch. Impact of strain induced by polymer curing in benzocyclobutene embedded semiconductor nanostructures. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, Volume: 8, Issue: 12, Pages: 1007-1010; DOI: 10.1002/pssr.201409346. | 2014 | Link |
A. Leonov, D. Ksenzov, A. Benediktovitch, I. Feranchuk, U. Pietsch. Time dependence of X-ray polarizability of a crystal induced by an intense femtosecond X-ray pulse. IUCRJ, Volume: 1, Pages: 402-417, Part: 6; DOI: 10.1107/S2052252514018156. | 2014 | Link |
A. Abboud, C. Kirchlechner, S. Send, J. S. Micha, O. Ulrich, N. Pashniak, L. Strüder, J. Keckes, U. Pietsch. A new method for polychromatic X-ray mu Laue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Rev. Sci. Instrum. 85, Issue: 11, Article Number: 113901; DOI: 10.1063/1.4900482. | 2014 | Link |
F. Alghabi, S. Send, U. Schipper, A. Abboud, N. Pashniak, U. Pietsch, A. Kolb. Fast GPU-based spot extraction for energy-dispersive X-ray Laue diffraction. Journal of Instrumentation, Volume 9, Article Number: T11003; DOI: 10.1088/1748-0221/9/11/T11003. | 2014 | Link |
B. Khanbabaee, S. Facsko, S. Doyle, U. Pietsch. Near-surface density profiling of Fe ion irradiated Si(100) using extremely asymmetric x-ray diffraction by variation of the wavelength. Appl. Phys. Lett. 105, Issue: 16, 163101; DOI: 10.1063/1.4899068. | 2014 | Link |
T. Rieger, T. Jörres, J. Vogel, A. Biermanns, U. Pietsch, D. Grützmacher, M. I. Lepsa. Crystallization of HfO2 in InAs/HfO2 core-shell nanowires. Nanotechnology, Volume 25, Number 40, Article Number: 405701; DOI: 10.1088/0957-4484/25/40/405701. | 2014 | Link |
K. Istomin, B. Dönges, N. Schell, H.-J. Christ, U. Pietsch. Analysis of VHCF damage in a duplex stainless steel using hard X-ray diffraction techniques. International Journal of Fatigue, Volume 66, Pages 177–182; DOI: 10.1016/j.ijfatigue.2014.04.001. | 2014 | Link |
B. Khanbabaee, D. Lützenkirchen-Hecht, R. Hübner, J. Grenzer, S. Facsko, U. Pietsch. Near surface silicide formation after off-normal Fe-implantation of Si (001) surfaces. JOURNAL OF APPLIED PHYSICS, Volume: 116, Issue: 2, Article Number: 024301; DOI: 10.1063/1.4887516. | 2014 | Link |
C. Gutt, L. Grodd, E. Mikayelyan, U. Pietsch, R. J. Kline, S. Grigorian. Local Orientational Structure of a P3HT pi-pi Conjugated Network Investigated by X-ray Nanodiffraction. JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 5(13), pp 2335–2339; DOI: 10.1021/jz500757p. | 2014 | Link |
D. Lützenkirchen-Hecht, R. Wagner, S. Szillat, A. K. Hüsecken, K. Istomin, U. Pietsch, R. Frahm. The multi-purpose hard X-ray beamline BL10 at the DELTA storage ring. J. Synchrotron Rad., 21, 819-826, Part: 4; DOI: 10.1107/S1600577514006705. | 2014 | Link |
A. Brand, B. Kaiser, A. Vagov, V. M. Axt, U. Pietsch. Non-Markovian behavior of ultrafast coherent ionization dynamics in a crystal exposed to a seeded free-electron-laser pulse. PHYSICAL REVIEW A, Volume: 89, Issue: 6, Article Number: 063404; DOI: 10.1103/PhysRevA.89.063404. | 2014 | Link |
E. Barrier, F. M. B. Fernandes, M. Bujan, M. C. Feiters, A. Froideval, J. Ghijsen, T. Hase, M. A. Hough, M. Jergel, I. Jimenez, T. Kajander, A. Kikas, M. Kokkinidis, L. Kover, H. B. Larsen, D. M. Lawson, K. Lawniczak-Jablonska, C. Mariani, P. Mikulik, J. Monnier, S. Morera, C. McGuinness, P. Müller-Buschbaum, M. Meedom Nielson, U. Pietsch, M. Tromp, M. Simon, J. Stangl, G. Zanotti. The benefit of the European User Community from transnational access to national radiation facilities. J. Synchrotron Rad. 21, 638-639, Part: 3; DOI: 10.1107/S1600577514007619. | 2014 | Link |